Published online by Cambridge University Press: 25 February 2011
Heteroepitaxial films of (111)BaF2/CaF2 on (111)silicon, and (111)BaF2 on (100)silicon are used as substrates for the growth of IV-VI semiconductors. X-ray diffraction measurements show that p-type PbSxSe1-x(0.4 < × < 0.5) films grown on BaF2/CaF2/Si(111) substrates have bi-crystalline (111) and (100) characteristics. This, combined with thermal stress may cause the heteroepitaxy to peel off from the silicon. Films grown on BaF2(111)/Si(100) substrates display only the (111) peaks, and are robust with respect to thermal strain.