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Femtosecond Dynamics of Highly Excited Semiconductors

Published online by Cambridge University Press:  26 February 2011

Charles V. Shank  and
Michael C. Downer
Charles V. Shank
Affiliation:
AT&T Bell Laboratories Holmdel, New Jersey 07733
Michael C. Downer
Affiliation:
AT&T Bell Laboratories Holmdel, New Jersey 07733
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Abstract

The advent of femtosecond optical pulse techniques has provided new opportunities for the investigation of the dynamical properties of highly excited semiconductors. In this paper we describe recent investigations of delayed Auger heating in Si.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 51: Symposium A – Beam-Solid Interactions and Phase Transformations , 1985 , 15
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. Knox, W. H., Fork, R. L., Downer, M. C., Stolen, R. H., and Shank, C. V., Appl. Phys. Lett., 46, 1120 (1985).CrossRefGoogle Scholar
2. Laser Solid Interactions and Laser Processing, edited by Ferris, S. D., Lemay, H. J. and Poate, J. M., (American Institute of Physics, New York, 1979).Google Scholar
3. Laser and Electron Beam Processing of Materials, edited by White, C. B. and Peercy, P. S., (Academic Press, New York, 1980).Google Scholar
4. Laser and Electron Beam Solid Interactions and Materials Processing, edited by Gibbons, J. F., Hess, L. D. and Sigmon, T. W., (Elsevier North-Holland, New York, 1981), Matd. Res. Soc. Symp. Proc., 1, (1981).Google Scholar
5. Laser and Electron Beam Interactions with Solids, edited by Appleton, B. R. and Celler, G. K., (Elsevier North-Holland, New York, 1982), Mat. Res. Soc. Symp. Proc., 4, 49 (1982).Google Scholar
6. Laser-Solid Interactions and Transient Thermal Processing of Materials, edited by Narayan, J., Brown, W. L. and Lemons, R. A., (Elsevier North-Holland, New York, 1983), Matl. Res. Soc. Symp. Proc., 13, (1983).Google Scholar
7. Laser Annealing of Semiconductors, edited by Poate, J. M. and Mayer, J. W. (Academic Press, New York, 1982).Google Scholar
8. Energy Beam-Solid Interactions and Transient Thermal Processing, edited by Fan, J. C. C. and Johnson, N. M., (Elsevier North-Holland, New York, 1984) Matl. Res. Soc. Symp. Proc., 23, (1984).Google Scholar
9. Liu, J. M., Ph.D. Dissertation, Harvard University, Cambridge, Massachusetts.Google Scholar
10. Kurz, H. and Bloembergen, N., Matl. Res. Soc. Symp. Proc., 35, 3 (1985) and references cited therein.CrossRefGoogle Scholar
11. Shank, C. V., Yen, R., and Hirlimann, C., Phys. Rev. Lett., 50, 454 (1983).CrossRefGoogle Scholar
12. Shank, C. V., Yen, R., and Hirlimann, C., Phys. Rev. Lett., 51, 900 (1983).CrossRefGoogle Scholar
13. Downer, M. C., Fork, R. L., and Shank, C. V., J. Opt. Soc. Am B, 2, 595 (1985).CrossRefGoogle Scholar
14. Fork, R. L., Greene, B. I., and Shank, C. V., Appl. Phys. Lett., 38, 671 (1981).CrossRefGoogle Scholar
15. Fork, R. L., Shank, C. V., and Yen, R., Appl. Phys. Lett., 41, 223 (1982).CrossRefGoogle Scholar
16. Fork, R. L., Shank, C. V., Hirlimann, C., Yen, R., and Tomlinson, W. J., Opt. Lett., 8, 1 (1983).CrossRefGoogle Scholar
17. Heavens, O. S., “Optical Properties of Thin Solid Films,” (New York, Dover Publications, 1985).Google Scholar
18. Jellison, G. E. Jr and Modine, F. A., Appl. Phys. Lett., 41, 120 (1982); Phys. Rev. B 27, 7466 (1983).Google Scholar
19. Miyao, M., Motooka, T., Natsuaki, N., and Tokuyama, T., Solid State Comm., 37, 605 (1981).CrossRefGoogle Scholar
20. Lompre, L. A., Liu, J. M., Kurz, H., and Bloembergen, N., Appl. Phys. Lett., 44, 3 (1984).CrossRefGoogle Scholar
21. Driel, H. M. van, Appl. Phys. Lett., 44, 617 (1984).CrossRefGoogle Scholar
22. Yang, G. and Bloembergen, N., to be published.Google Scholar
23. Dziewior, J. and Schmid, W., Appl. Phys. Lett., 31, 346 (1977).CrossRefGoogle Scholar
24. Yoffa, E. J., Phys. Rev. B., 21, 2415 (1980).CrossRefGoogle Scholar