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Extending AFM Phase Image of Nanocomposite Structures to 3D using FIB

Published online by Cambridge University Press:  27 February 2012

Russell J. Bailey ,
Remco Geurts ,
Debbie J. Stokes ,
Frank de Jong  and
Asa H. Barber
Russell J. Bailey
Affiliation:
Department of Materials, School of Engineering & Materials Science, Queen Mary University of London, London E1 4NS United Kingdom.
Remco Geurts
Affiliation:
FEI Company, 5651 GG Eindhoven, Netherlands.
Debbie J. Stokes
Affiliation:
FEI Company, 5651 GG Eindhoven, Netherlands.
Frank de Jong
Affiliation:
FEI Company, 5651 GG Eindhoven, Netherlands.
Asa H. Barber
Affiliation:
Department of Materials, School of Engineering & Materials Science, Queen Mary University of London, London E1 4NS United Kingdom.
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Abstract

The mechanical behavior of nanocomposites is critically dependent on their structural composition. In this paper we use Focused Ion Beam (FIB) microscopy to prepare surfaces from a layered polymer nanocomposite for investigation using phase contrast atomic force microscopy (AFM). Phase contrast AFM provides mechanical information on the surface examined and, by combining with the sequential cross-sectioning of FIB, can extend the phase contract AFM into three dimensions.

Keywords

scanning probe microscopy (SPM)nanostructurecomposite

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1421: Symposium PP – Three-Dimensional Tomography of Materials , 2012 , mrsf11-1421-pp07-09
Copyright
Copyright © Materials Research Society 2012

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References

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