Hostname: page-component-745bb68f8f-l4dxg Total loading time: 0 Render date: 2025-02-10T12:50:36.306Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluation Of YBa2Cu3O7-δ Sol-Gel Derived Films On Sapphire Substrates Produced From Different Cu(Ii) Alkoxide Groups.

Published online by Cambridge University Press:  28 February 2011

D.S. Kenzer ,
M.R. Teepe ,
G.A. Moore  and
G. Kordas
M.R. Teepe
Affiliation:
Science and Technology Center for Superconductivity, Materials Research Laboratory, Department of Materials Science and Engineering, Ceramics Division, University of Illinois at Urbana-Champaign, 105 S. Goodwin, Urbana, IL 61801
G.A. Moore
Affiliation:
Science and Technology Center for Superconductivity, Materials Research Laboratory, Department of Materials Science and Engineering, Ceramics Division, University of Illinois at Urbana-Champaign, 105 S. Goodwin, Urbana, IL 61801
G. Kordas
Affiliation:
Science and Technology Center for Superconductivity, Materials Research Laboratory, Department of Materials Science and Engineering, Ceramics Division, University of Illinois at Urbana-Champaign, 105 S. Goodwin, Urbana, IL 61801
Get access

Abstract

Yttrium methoxyethoxide, barium methoxyethoxide and various copper(II) alkoxide groups were used as precursors for the formation of YBa2Cu3O7-δ stable sols in a 2- methoxyethanol / methyl ethyl ketone / toluene / diisopropyl ketone solvent system. Sol fractal dimensions were varied with the sol concentration and with the addition of pyridine. Strong correlation was found between the wettability and the fractal dimensions of the various precursors as determined by contact angle measurements. YBa2Cu3O7-δ thin films were deposited on sapphire substrates using a dip-coating technique. The films were fired at 850°C under flowing oxygen or an ozone/oxygen mixture. Although the ozonetreatments helped in the formation of single YBa2Cu3O7-δ phase, they contributed to extensive cracking in the films. The different copper(II) alkoxide precursors had little effect on final film microstructure.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 180: Symposium A – Better Ceramics Through Chemistry IV , 1990 , 947
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Enomoto, Y., Murakami, T., Suzuki, M., and Moriwaki, K., Jpn. J. Appl. Phys. 26(1987)1248 Google Scholar
2. Char, K., Kent, A.D., Kapitulnik, A., Beasley, M.R., and Geballe, T.H., Appl. Phys. Lett., 51(1987)1370.Google Scholar
3. Webb, C., Weng, S.L., Eckstein, J.N., Missert, N., Char, K., Schlom, D.G., Hellman, E.S., Beasley, M.R., and Harris, J.S. Jr., Appl. Phys. Lett., 51(1987)1191.Google Scholar
4. Dijkamp, D., Venkatesan, T., Wu, X.D., Shaheen, S.A., Jisrawi, N., Min-Lee, Y.H., McLean, W.L., and Croft, M., Appl. Phys. Lett., B 57(1988)167.Google Scholar
5. Kramer, S.A., Kordas, G., McMillan, J., Hilton, G.C., and Van Harlingen, D.J., Appl. Phys. Lett., 53(1988)156.Google Scholar
6. Moore, G., Kramer, S., and Kordas, G., Mat. Lett., 7(1989)415.Google Scholar