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Engineered Microstructures and Transport Properties in YBCO Coated Conductors

Published online by Cambridge University Press:  18 March 2011

T. G. Holesinger ,
B. J. Gibbons ,
J. Y. Coulter ,
S. R. Foltyn ,
J. R. Groves  and
P. N. Arendt
T. G. Holesinger
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 U.S.A.
B. J. Gibbons
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 U.S.A.
J. Y. Coulter
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 U.S.A.
S. R. Foltyn
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 U.S.A.
J. R. Groves
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 U.S.A.
P. N. Arendt
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 U.S.A.
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Abstract

Each process used to deposit or make the bi-axially textured template, buffer layer(s), and the superconductor in a coated conductor creates interfaces along which defects or interfacial reactions may result. These defects can be additive and propagate through the entire film structure to affect the growth and properties of the superconducting film. Defects within the films and their corresponding transport properties have been correlated with the differences in the thickness of the underlying buffer layer material. This knowledge can be used to control and engineer the structure of the coated conductor to maximize critical current densities.

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References

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