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Electronic Structures of Heavily Boron-doped Superconducting Diamond Films

Published online by Cambridge University Press:  01 February 2011

Takayoshi Yokoya ,
Hiroyuki Okazaki ,
Tetsuya Nakamura ,
Tomohiro Matsushita ,
Takayuki Muro ,
Eiji Ikenaga ,
Masaaki Kobata ,
Keisuke Kobayashi ,
Akihisa Takeuchi  and
Akihiro Awaji
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Takayoshi Yokoya
Affiliation:
yokoya@cc.okayama-u.ac.jp, Okayama University, The Graduate School of Natural Science and Technology,, 3-1-1,Tsushima-naka, Okayama, 700-8530, Japan, +81-86-251-7897, +81-86-251-7903
Hiroyuki Okazaki
Affiliation:
yuzan@cc.okayama-u.ac.jp, Okayama University, The Graduate School of Natural Science and Technology, 3-1-1,Tsushima-naka, Okayama, 700-8530, Japan
Tetsuya Nakamura
Affiliation:
naka@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Tomohiro Matsushita
Affiliation:
matushita@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Takayuki Muro
Affiliation:
muro@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Eiji Ikenaga
Affiliation:
ikenaga@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Masaaki Kobata
Affiliation:
mkobata@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Keisuke Kobayashi
Affiliation:
koba_kei@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Akihisa Takeuchi
Affiliation:
takeuchi@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Akihiro Awaji
Affiliation:
awaji@spring8.or.jp, Japan Synchrotron Radiation Research Institute(JASRI)/Spring-8, 1-1-1 Kouto, Sayo, 679-5198, Japan
Yoshihiko Takano
Affiliation:
TAKANO.Yoshihiko@nims.go.jp, National Institute for Material Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Masanori Nagao
Affiliation:
NAGAO.Masanori@nims.go.jp, National Institute for Material Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Tomohiro Takenouchi
Affiliation:
chidai@moegi.waseda.ac.jp, Waseda Univeristy, School of Science and Engineering, 3-4-1 Okubo, Shinjuku, 169-8555, Japan
Hiroshi Kawarada
Affiliation:
kawarada@waseda.jp, Waseda Univeristy, School of Science and Engineering, 3-4-1 Okubo, Shinjuku, 169-8555, Japan
Tamio Oguchi
Affiliation:
Oguchi@hiroshima-u.ac.jp, Hiroshima University, Department of Quantum Matter, Graduate School of Advanced Sciences of Matter (ADSM), 1-3-1 Kagamiyama, Higashi-Hiroshima, 739-8530, Japan
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Abstract

Recent photoemission studies on heavily boron-doped superconducting diamond films, reporting the electronic structure evolution as a function of boron concentrations, are reviewed. From soft X-ray angle-resolved photoemission spectroscopy, which directly measures electronic band dispersions, depopulation of electrons (or formation of hole pockets) at the top of the valence band were clearly observed. This indicates that the holes at the top of the valence bands are responsible for the metallic properties and hence superconductivity at lower temperatures. Hard X-ray photoemission spectroscopy observed shift of the main C 1s core level and intensity evolution of a lower binding energy additional structure, suggesting chemical potential shift, carrier doping efficiency by boron doping, and possibility of boron-related cluster formations.

Keywords

electronic structurediamondphotoemission
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 956: Symposium J – Diamond Electronics—Fundamentals to Applications , 2006 , 0956-J03-01
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Nebel, C. E. and Ristein, J., Thin-film diamond II, Elsevier B.V., Amsterdam, 2004.Google Scholar
2. Ekimov, E.A., Sidorov, V.A., Bauer, E.D., Mel'nik, N.N., Curro, N.J., Thompson, J.D., and Stishov, S.M., Nature 428, 542 (2004).Google Scholar
3. Takano, Y., Nagao, M., Sakaguchi, I., Tachiki, M., Hatano, T., Kobayashi, K., Umezawa, H., and Kawarada, H., Appl. Phys. Lett. 85, 2851 (2004).Google Scholar
4. Bustarret, E., Gheeraert, F., and Watanabe, K., Phys. Rev. Lett. 93, 237005 (2004).Google Scholar
5. H., Umezawa et al.: cond-mat/0503303.Google Scholar
6. Ashcroft, N. W. and Mermin, N. D., Solid State Physics. Saunders College Publishing, Fortworth, 1976.Google Scholar
7. Kortus, J., Nature Materials 4, 879 (2005).Google Scholar
8. Baskaran, G.: cond-mat/0404286.Google Scholar
9. Boeri, L., Kortus, J., and K Andersen, O., Phys. Rev. Lett. 93, 237002 (2004).Google Scholar
10. Lee, K.-W. and Pickett, W. E., Phys. Rev. Lett. 93, 237003 (2004).Google Scholar
11. Blasé, X., Adessi, Ch., and Connetable, D., Phys. Rev. Lett. 93, 237004 (2004).Google Scholar
12. Xiang, H. J., li, Z., Yamg, J., Hou, J. G., and Zhu, Q., Phys. Rev. B 70, 212504 (2004).Google Scholar
13. Yokoya, T., Nakamura, T., Matsushita, T., Muro, T., Takano, Y., Nagao, M., Takenouchi, T., Kawarada, Y., and Oguchi, T., Nature 438, 647 (2005).Google Scholar
14. Yokoya, T. et al., submitted.Google Scholar
15. Kobayashi, K., Yabashi, M., Takata, Y., Tokushima, T., Shin, S., Tamasaku, K., Miwa, D., Ishikawa, T., Nohira, H., Hattori, T., Sugita, Y., Nakatsuka, O., Sakai, A., and Zaima, S., Appl. Phys. Lett. 83, 1005 (2003).Google Scholar
16. Seah, M.P. and Dench, W.A., Surface. Interface. Anal. 1, 2 (1979).Google Scholar
17. Yeh, J.J. and Lindau, I., At. Data and Nucl. Data Tables 32, 1 (1985).Google Scholar
18. Nakamura, J., Oguchi, T., Yamada, N., Kuroki, K., Okada, K., Takano, Y., Nagao, M., Sakaguchi, I., Kawarada, H., Petera, R.C.C., and Ederer, D.L., cond-mat/0410144.Google Scholar
19. Wu, D., Ma, Y.C., Wang, Z.L., Luo, Q., Gu, C.Z., Wang, N.L., Li, C.Y., Lu, X.Y., and Jin, Z.S., Phys. Rev. B 73, 012501 (2006).Google Scholar
20. Morar, J. F., Himpsel, F. J., Hollinger, G., Jordan, J. L., Hughes, G., and McFeely, F. R., Phys. Rev. B 33, 1340 (1986).Google Scholar
21. Oguchi, T., private communications.Google Scholar
22. Díaz, J., Paolicelli, G., Ferrer, S., and Comin, F., Phys. Rev. B. 54, 8064 (1996).Google Scholar
23. Bourgeois, E., Bustarret, E., Achatz, P., Omnes, F., and Blasé, X., Phys. Rev. B 74, 094509 (2006).Google Scholar
24. Katayama-Yoshida, H., private communications. 0956-J03-Google Scholar