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Development of Quantitative X-Ray Microtomography

Published online by Cambridge University Press:  22 February 2011

H. W. Deckman ,
J. H. Dunsmuir ,
K. L. D'Amico ,
S. R. Ferguson  and
B. P. Flannery
H. W. Deckman
Affiliation:
Corporate Research Laboratory, Exxon Research and Engineering Co., Rt. 22 East Annandale, NJ 08801
J. H. Dunsmuir
Affiliation:
Corporate Research Laboratory, Exxon Research and Engineering Co., Rt. 22 East Annandale, NJ 08801
K. L. D'Amico
Affiliation:
Corporate Research Laboratory, Exxon Research and Engineering Co., Rt. 22 East Annandale, NJ 08801
S. R. Ferguson
Affiliation:
Corporate Research Laboratory, Exxon Research and Engineering Co., Rt. 22 East Annandale, NJ 08801
B. P. Flannery
Affiliation:
Corporate Research Laboratory, Exxon Research and Engineering Co., Rt. 22 East Annandale, NJ 08801
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Abstract

We have developed several x-ray microtomography systems which function as quantitative three dimensional x-ray microscopes. In this paper we describe the evolutionary path followed from making the first high resolution experimental microscopes to later generations which can be routinely used for investigating materials. Developing the instrumentation for reliable quantitative x-ray microscopy using synchrotron and laboratory based x-ray sources has led to other imaging modalities for obtaining temporal and spatial two dimensional information.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 217: Symposium U – Advanced Tomographic Imaging Methods for the Analysis of Materials , 1990 , 97
Copyright
Copyright © Materials Research Society 1991

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References

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