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Deposition and Characterization of Eu:Y2O3 Red Phosphor Thin Films

Published online by Cambridge University Press:  10 February 2011

S. L. Jones ,
D. Kumar ,
Rajiv K. Singh  and
P. H. Holloway
S. L. Jones
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611–6400.
D. Kumar
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611–6400.
Rajiv K. Singh
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611–6400.
P. H. Holloway
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611–6400.
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Abstract

Thin film phosphors are very promising for the fabrication of flat panel field emission displays (FEDs). In the present paper we have reported the growth and characterization of Eu:Y2O3 phosphor thin films. The effect of surface roughness and crystallinity on the brightness of phosphor films have been studied. A post annealing treatment of the films have been found to result in the realization of Eu:Y2O3 films with 70% brightness compared to powder materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 471: Symposium G – Flat Panel Display Materials III , 1997 , 299
Copyright
Copyright © Materials Research Society 1997

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References

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