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The Connection of Sum Rule and Branching Ratio Analyses of Magnetic X-Ray Circular Dichroism in 3d Systems

Published online by Cambridge University Press:  15 February 2011

J.G. Tobin ,
G.D. Waddill ,
A.F. Jankowski ,
P.A. Sterne  and
D.P. Pappas
J.G. Tobin
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Department, Livermore, CA 94550 •, USA
G.D. Waddill
Affiliation:
University of Missouri-Rolla, Department of Physics, Rolla, MO 65401-0249 •, USA
A.F. Jankowski
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Department, Livermore, CA 94550 •, USA
P.A. Sterne
Affiliation:
University of California-Davis, Department of Physics, Davis, CA 95616 •, USA
D.P. Pappas
Affiliation:
Virginia Commonwealth University, Department of Physics, Richmond, VA 23284-2000 •, USA
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Extract

In the recent past, Carra, et al. derived a sum rule for electric dipole transitions in a single ion model that could be used to extract an elementally-specific spin-magnetic-moment (μSPIN) from magnetic x-ray circular dichroism (MXCD) spectra. Earlier, we proposed the utilization of a branching ratio analysis for the determination of μSPIN, based upon a simplified oneelectron, atomic picture which assumed complete orbital quenching. Here, it will be shown that these two approaches are essentially related in the case of 3d ferromagnetic materials. Both methods are based upon a comparison of the integrated intensity in the L3(J=3/2) white line peak versus the sum of the intensities in the L3(J=3/2) and L2(J=l/2) peaks, after background removal. An error estimate will also be presented. A more complete description of our work is under preparation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 384: Symposium L – Magnetic Ultrathin films, Multilayers and Surfaces , 1995 , 457
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1. Carra, P., Thole, B.T., Altarelli, M., and Wang, X., Phys. Rev. Lett. 70, 694 (1993).Google Scholar
2. Carra, P., Syn. Rad. News. 5, 21 (1992).Google Scholar
3. Carra, P., Jpn. J. Appl. Phys. Preprint.Google Scholar
4. Tobin, J.G., Waddill, G.D., and Pappas, D.P., Phys. Rev. Lett. 68, 3642 (1992).Google Scholar
5. Tobin, J.G., Waddill, G.D., Jankowski, A.F., Pappas, D.P., and Sterne, P.A. submitted to Phys. Rev. B, 1995.Google Scholar
6. Vanderlaan, G. and Thole, B.T., Phys. Rev. B 43, 13401 (1991); 42,6670 (1990); 38, 3158 (1988).Google Scholar
7. Smith, N.V., Chen, C.T., Sette, F., and Mattheiss, L.F., Phys. Rev. B 46, 1023 (1992).Google Scholar