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Compositional Analysis and High Resolution Imaging of Grain Boundaries in Pr-DOPED ZnO Ceramics

Published online by Cambridge University Press:  15 February 2011

I. G. Solorzano ,
J. B. Vander Sande ,
K. K. Baek  and
H. L. Tuller
I. G. Solorzano
Affiliation:
Center for Materials Science and Engineering, MIT, Cambridge, MA 02139, USA
J. B. Vander Sande
Affiliation:
Center for Materials Science and Engineering, MIT, Cambridge, MA 02139, USA
K. K. Baek
Affiliation:
Center for Materials Science and Engineering, MIT, Cambridge, MA 02139, USA
H. L. Tuller
Affiliation:
Center for Materials Science and Engineering, MIT, Cambridge, MA 02139, USA
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Abstract

An electron microscopy investigation has been conducted in ZnO:Pr:Co varistor structures prepared by a new in-diffusion method. It has been shown that some boundaries host intergranular precipitates of a Prx Oy-based phase. All observations lead to the conclusion that grain boundaries exhibit Pr segregation, while Co is homogeneously distributed in the ZnO matrix. No continuous intermediate layer is present at the ZnO/ZnO boundary nor at the Pr2O3/ZnO interfaces. This is consistent with a barrier model based solely on a space charge depletion region(s).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 295: Symposium W – Atomic-Scale Imaging of Surfaces and Interfaces , 1992 , 189
Copyright
Copyright © Materials Research Society 1993

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References

[1] Matsuoka, M., Jpn. J. Appl. Phys., 10, 736 (1971)Google Scholar
[2] Moris, W. G., J. Vac. Sci. Technol., 13, 925 (1976)Google Scholar
[3] Clark, D. R., J. Appl. Phys., IQ, 6829 (1979)Google Scholar
[4] Kingery, W. D., Sande, J. B. VanDer and Matamura, T., J. Am. Ceram. Soc., 62, 221 (1979)Google Scholar
[5] Back, K. K., Broniatowski, A. and Tuller, H. L., in proc. 6th Intl. Conf. Intergranular and Interphase Boundaries in Materials. Greece, June 1992 Google Scholar
[6] Wong, J., Rao, P. and Koch, E. F., J. Appl. Phys., 46, 1827 (1975)Google Scholar
[7] Mukae, K., Cer. Bull., 66, 1239 (1987)Google Scholar
[8] Gambino, J. P., Kingery, W. D., Pike, G. E., Levinson, L. M. and Phillipp, H. R., J. Am. Ceram. Soc., 22, 642 (1989)Google Scholar
[9] Kanai, H., Imai, M. and Takahaski, T., J. Mat. Sci., 20, 3975 (1985)Google Scholar