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Charge Carrier TransportMechanism of ð-Conjugated Organic Materials

Published online by Cambridge University Press:  15 February 2011

Seong Hyun Kim ,
Yong Suk Yang ,
Jung Hun Lee ,
Sang Chul Lim  and
Taehyoung Zyung
Seong Hyun Kim
Affiliation:
Basic Research Laboratory, ETRI 161 Gajeong-Dong, Yusong-Gu, Daejon 305-350, Korea
Yong Suk Yang
Affiliation:
Basic Research Laboratory, ETRI 161 Gajeong-Dong, Yusong-Gu, Daejon 305-350, Korea
Jung Hun Lee
Affiliation:
Basic Research Laboratory, ETRI 161 Gajeong-Dong, Yusong-Gu, Daejon 305-350, Korea
Sang Chul Lim
Affiliation:
Basic Research Laboratory, ETRI 161 Gajeong-Dong, Yusong-Gu, Daejon 305-350, Korea
Taehyoung Zyung
Affiliation:
Basic Research Laboratory, ETRI 161 Gajeong-Dong, Yusong-Gu, Daejon 305-350, Korea
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Abstract

The complex dielectric constants of several π-conjugated materials were measured, and generalized Langevin equation was used to analyze the dielectric behavior in the frequency domain. From the results of the fitting the experimental data using the generalized Langevin equation, we suggest that the charge carriers are electrically screened by the neighboring charges through the structural relaxation, and the carriers are not interact each other. We confirmed that the generalized Langevin equation offers a very good approach to analyze and understand the transport properties of charge carriers in π-conjugated materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 769: Symposium H – Flexible Electronics - Materials and Device Technology , 2003 , H3.5
Copyright
Copyright © Materials Research Society 2003

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References

1. Kudo, K., Wang, D.X., Lizuka, M., Kuniyoshi, S. and Tanaka, K., Synth. Met. 111, 11 (2000).Google Scholar
2. Podzorvo, V., Pudalov, V. M. and Gershenson, M. E., Appl. Phy. Lett. 82, 1739 (2003).Google Scholar
3. Lu, M.-H. and Sturm, J. C., J. Appl. Phys. 91, 595 (2002).Google Scholar
4. Feller, F., Geschke, D. and Monkman, A. P., J. Appl. Phys. 93, 2884 (2003).Google Scholar
5. Rakhmanova, S. V. and Conwell, E. M., Appl. Phys. Lett. 76, 3822 (2000).Google Scholar
6. Campbell, A. J., Bradley, D. D. C., Antoniadis, H., Inbasekaran, M., Wu, W.W. and Woo, E. P., Appl. Phys. Lett. 76, 1734 (2000).Google Scholar
7. Street, R. A., Knipp, D. and Völkel, A. R., Appl. Phys. Lett. 80, 1658 (2002).Google Scholar
8. Campbell, I. H., Smith, D. L., and Ferraris, J. P., Appl. Phys. Lett. 66, 3030 (1995).Google Scholar
9. Campbell, I. H., Smith, D. L., Neef, C. J., and Ferraris, J. P., Appl. Phys. Lett. 72, 2565 (1998).Google Scholar
10. Yu, G., Gao, Y., Zhang, C., Li, Y., Gao, J., and Heeger, A. J., Appl. Phys. Lett. 73, 111 (1998).Google Scholar
11. Kim, S. H., Choi, K. H., Lee, H. M., Hwang, D. H., Do, L.M., Chu, H. Y., and Zyung, T., J. Appl. Phys. 87, 882 (2000).Google Scholar
12. Kim, S. H., Zyoung, T., Chu, H. Y., Do, L. M., Hwang, D. H., Phys. Rev. B 61, 15854 (2000).Google Scholar
13. Jonscher, A. K., Dielectric Relaxation in Solids (Chelsea Dielectrics, London, 1983), p 37.Google Scholar
14. Brüesch, P., Strssler, S., and Zeller, H. R., Phys. Status Solidi A31, 217 (1975).Google Scholar
15. Zyung, T. and Jung, S. D., ETRI Journal 18, 181 (1996).Google Scholar
16. Kim, S.H., Yang, Y. S., Kim, H. J., Ryu, N.Y., andJang, M. S., Ferroelectrics 196, 261 (1997).Google Scholar
17. Nagashima, H.N., Onody, R. N., and Faria, R.M., Phys. Rev. B 59, 905 (1999).Google Scholar
18. Ito, K., Tanabe, Y., Akagi, K., and Shirakawa, H., Phys. Rev. B. 45, 1256 (1992).Google Scholar
19. Lepienski, C. M., Faria, R. M., and Ferreira, G. F. Leal, Appl. Phys. Lett., 70, 1906 (1997).Google Scholar
20. Rehawald, W., Kiess, H., and Binggeli, B., Z. Phys. B 68, 143 (1987).Google Scholar
21. Jonscher, A. K., Universal Relaxation Law (Chelsea Dielectrics, London, 1996), p 311.Google Scholar
22. Jonscher, A. K., Dielectric Relaxation in Solids (Chelsea Dielectrics, London, 1983), p 306.Google Scholar