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Characterization Of Thin Semiconductor Films For (Opto)Electronic Applications

Published online by Cambridge University Press:  10 February 2011

J. R. Elmiger ,
H. Feist  and
M. Kunst
J. R. Elmiger
Affiliation:
Hahn-Meitner-Institut, Department Solare Energetik, Glienicker Str. 100, 14109 Berlin, Germany
H. Feist
Affiliation:
Hahn-Meitner-Institut, Department Solare Energetik, Glienicker Str. 100, 14109 Berlin, Germany
M. Kunst
Affiliation:
Hahn-Meitner-Institut, Department Solare Energetik, Glienicker Str. 100, 14109 Berlin, Germany
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Abstract

A simple set-up to measure the transient photoconductivity in the microwave frequency range is presented. The effective mobility is derived from the end of pulse transient photoconductivity. This can be used for the characterization of semiconductor films. Examples of measurements on a-Si:H films are given.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996 , 267
Copyright
Copyright © Materials Research Society 1996

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References

1. Kunst, M., MRS Symposium Proceedings 189,75 (1990)Google Scholar
2. Sanders, A., Wetzel, H. and Kunst, M., MRS Symposium Proceedings 189,403(1990)Google Scholar
3. Swiatkowski, C., Sanders, A., Kunst, M., Seidelmann, G., Haffer, C. and Emmelmann, K., MRS Symposium Proceedings 269,491 (1992)Google Scholar
4. Swiatkowski, C., Sanders, A., Buhre, K.-D., and Kunst, M., J.Appl. Phys. 78, 1763 (1995)Google Scholar