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Change Of SI(111) Surface Reconstruction Under Noble Metal Films

Published online by Cambridge University Press:  21 February 2011

Hawoong Hong ,
Richard Aburano ,
D.-S. Lin ,
T.-C. Chiang ,
Haydn Chen ,
P. Zschack  and
E. D. SPECHT
Hawoong Hong
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Ave, Urbana, IL 61801
Richard Aburano
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Ave, Urbana, IL 61801
D.-S. Lin
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Ave, Urbana, IL 61801
T.-C. Chiang
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Ave, Urbana, IL 61801
Haydn Chen
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Ave, Urbana, IL 61801
P. Zschack
Affiliation:
Metal and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
E. D. SPECHT
Affiliation:
Metal and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
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Abstract

Interface structures between Si(111) and thick noble metal overlayers are studied by grazing-angle-incidence x-ray diffraction and crystal truncation rods. The 7×7 reconstruction is only preserved under a Ag film deposited at room temperature. This capped 7×7 structure changed to a 1×1 structure upon annealing over 250°C. A thick overlayer of room temperature deposited Au film destroyed the 7×7 reconstruction and changed the interface structure to 1×1. Our results are compared to a thick Cu/Si(111) interface structure1.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991 , 387
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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