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Atomic Resolution Electron Microscopy of Bismuth Cuprates

Published online by Cambridge University Press:  28 February 2011

R. Ramesh ,
B.G. Bagley ,
J.M. Tarascon ,
C.J.D. Hetherington ,
G. Thomas ,
S.M. Green  and
H.L. Luo
R. Ramesh
Affiliation:
Bellcore, Red Bank, NJ 07701
B.G. Bagley
Affiliation:
Bellcore, Red Bank, NJ 07701
J.M. Tarascon
Affiliation:
Bellcore, Red Bank, NJ 07701
C.J.D. Hetherington
Affiliation:
National Center for Electron Microscopy Lawrence Berkeley Laboratory, Berkeley CA 94720.
G. Thomas
Affiliation:
National Center for Electron Microscopy Lawrence Berkeley Laboratory, Berkeley CA 94720.
S.M. Green
Affiliation:
Department of Electrical and Computer Engineering University of California, San Diego, LaJolla, CA 92093.
H.L. Luo
Affiliation:
Department of Electrical and Computer Engineering University of California, San Diego, LaJolla, CA 92093.
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Extract

Since the discovery of superconductivity in certain classes of cuprates, there has been much research activity aimed at understanding the structure, microstructure, electrical and other physical properties of these materials. In this paper, we present a summary of the current status of on-going research on structural and microstructural characterization of the Bi cuprates and cationically substituted derivatives of these superconducting compounds. High resolution structural imaging together with conventional and analytical electron microscopy is used to examine the structure[l]. The overall aim of these studies is to characterize the structural and microstructural evolution and ultimately to determine the effect on the superconducting properties.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 777
Copyright
Copyright © Materials Research Society 1990

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References

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