Hostname: page-component-745bb68f8f-lrblm Total loading time: 0 Render date: 2025-01-29T00:10:17.577Z Has data issue: false hasContentIssue false
  • English
  • Français

An X-Ray Scattering Study of Amorphous Hydrogenated Carbon

Published online by Cambridge University Press:  25 February 2011

T.M. Burke ,
D.W. Huxley ,
R.J. Newport ,
G. Bushnell-Wye  and
J. Franks
T.M. Burke
Affiliation:
Physics Laboratory, The University, Canterbury, Kent CT2 7NR, UK
D.W. Huxley
Affiliation:
Physics Laboratory, The University, Canterbury, Kent CT2 7NR, UK
R.J. Newport
Affiliation:
Physics Laboratory, The University, Canterbury, Kent CT2 7NR, UK
G. Bushnell-Wye
Affiliation:
SRS, Daresbury Laboratory, Daresbury, Warrington, WA4 4AD
J. Franks
Affiliation:
Diavac ACM Ltd, 2 Brookfield Avenue, Ealing, London W5 1LA, UK
Get access

Abstract

The structure of “diamond-like” carbon, a-C:H has been studied using the Xray diffraction facilities available at the Synchrotron Radiation Source (Daresbury Lab, UK). The principle advantage of using the SRS is that high fluxes are available at short wavelengths (λ ∼ 0.6Å): it is therefore possible to extract the “diffuse” scattering profile associated with all amorphous systems with considerable precision over a very wide K-range. A novel diffraction technique is also described in which the X-ray beam is incident on an as-deposited thin film at or near the critical angle. In this geometry we demonstrate that it is possible to gather diffraction data on -1μm films in-situ.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 270: Symposium M – Novel Forms of Carbon , 1992 , 457
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Evans, A.C., Franks, J. and Revell, P.J., Med. Device Technol, May '92, 26.Google Scholar
2. Angus, J.C., Koidl, P. and Domitz, S. “Plasma Deposited Thin Films” (Chapter 4), CRC Press (1986).Google Scholar
3. Lim, G., Parrish, W., Ortiz, C., Belloto, M. and Hart, M., J. Mater. Res. 2, 471 (1987).Google Scholar
4. Cernikand, R. Hart, M., Nucl. Instr. Meth., A281, 403 (1989).Google Scholar
5. Huxley, D., Newport, R., Howells, W. and Franks, J., MRS Spring'92 Meeting Proc.Google Scholar
6. Bushnell-Wye, G. et al. , Rev. Sd. Instr., 63, 1153 (1992).CrossRefGoogle Scholar