Published online by Cambridge University Press: 28 February 2011
The thin film growth of PbTiO3 by MOCVD has been investigated using both a pyrolytic process and a sputter assisted plasma deposition process. In the first process, lead tertiary butoxide and titanium iso-propoxide are introduced to a low pressure reactor simultaneously to deposit thin films containing lead and titanium onto a hot substrate (400–500 °C). In the alternative process lead is sputtered from a magnetron target in the presence of titanium isopropoxide vapour. Thin films containing lead and titanium are deposited onto a substrate which need not be heated. X-ray and EDAX analysis indicate the presence of Ti02 and elemental lead in the as grown layers. Oxygen annealing of ihese layers at 900° and 1100°C leads to the formation of polycrystalline PbTiO3 and where the substrate is silicon, a PbO/SiO2 glass phase.