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X-Ray Diffraction Applied to the Study of Defects in Surfaces

Published online by Cambridge University Press:  25 February 2011

I. K. Robinson  and
K. L. D'amico
I. K. Robinson
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
K. L. D'amico
Affiliation:
Physics Department, Brookhaven National Laboratory Upton, New York 11973
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Abstract

The role of x-ray diffraction in characterising defects in crystals is reviewed briefly. It is most sensitive to the presence of plane defects which destroy the long-range order. The same argument is shown to apply to line defects in surface structures. Two recent glancing incidence x-ray diffraction experiments provide contrasting examples: randomly distributed steps are found in the Au(110) reconstructed surface, while regular arrays of domain walls modify certain phases of krypton monolayers physisorbed on graphite substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 161
Copyright
Copyright © Materials Research Society 1985

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References

[1] Robinson, I. K., Proceedings of the 1st International Conference on the Structure of Surfaces (ICSOS), Springer Verlag (1984).Google Scholar
[2] Brennan, S., Eisenberger, P., Nucl. Inst. Meth. 222, 164 (1984); P. H. Fuoss, I. K. Robinson, Nucl. Inst. Meth. 222, 171 (1984).10.1016/0167-5087(84)90521-0Google Scholar
[3] Robinson, I. K., Phys. Rev. Lett. 50, 1145 (1983).10.1103/PhysRevLett.50.1145Google Scholar
[4] Moritz, W., Wolf, D., Surf. Sci. 88, L29 (1979).10.1016/0039-6028(79)90093-1Google Scholar
[5] Binnig, G., Rohrer, H., Gerber, C., Weibel, E., Surf. Sci. 131, L379 (1983).10.1016/0039-6028(83)90112-7Google Scholar
[6] Marks, L., Phys. Rev. Lett. 51, 1000 (1983).10.1103/PhysRevLett.51.1000Google Scholar
[7] Kuk, Y., Feldman, L. C., Robinson, I. K., Surf. Sci. 138, L168 (1984).10.1016/0039-6028(84)90246-2CrossRefGoogle Scholar
[8] Brocksch, H. J., Benneman, K. H., Proceedings ICSOS, Springer Verlag (1984).Google Scholar
[9] Halicoglu, T., Takai, T., Tiller, W. A., Proceedings ICSOS, Springer Verlag (1984).Google Scholar
[10] Jagodzinkski, H., Acta. Cryst. 2, 201 (1949); A. Guinier “X-ray diffraction”, Freeman, W. H. (1963).10.1107/S0365110X49000552Google Scholar
[11] Cowley, J. M., Acta. Cryst. A 32, 88 (1976).10.1107/S0567739476000168Google Scholar
[12] Moritz, W., Wolf, D., Proceedings 4th Int. Conf. on Surf. Sci. 1295 (1980); D. Wolf, H. Jagodzinski, W. Moritz, Surf. Sci. 77, 265 (1978).Google Scholar
[13] D'Amico, K. L., Moncton, D. E., Specht, E. D., Birgeneau, R. J., Nagler, S. E., Horn, P. M., Phys. Rev. Lett. 53 2250 (1984).10.1103/PhysRevLett.53.2250CrossRefGoogle Scholar
[14] Stevens, P. W., Heiney, P. A., Birgeneau, R. J., Horn, P. M., Moncton, D. E., Brown, G. S., Phys. Rev. B29 3512 (1984).10.1103/PhysRevB.29.3512Google Scholar
[15] Novaco, A. D., McTague, J. P., Phys. Rev. Lett. 38, 1286 (1977).10.1103/PhysRevLett.38.1286Google Scholar
[16] Shiba, H., J. Phys. Soc. Japan 48, 211 (1980).10.1143/JPSJ.48.211Google Scholar
[17] Shabes-Retchkiman, P. S. and Venables, J. A., Surf. Sci., 105, 536 (1981).10.1016/0039-6028(81)90017-0Google Scholar
[18] Shaw, C. G., Fain, S. C. Jr., and Chinn, M. D., Phys. Rev. Lett., 41, 955 (1978).10.1103/PhysRevLett.41.955CrossRefGoogle Scholar