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X-Ray Characterization of the Crystallization Process of High-TC Superconducting Oxides in the Sr-Bi-Pb-Ca-Cu-O System

Published online by Cambridge University Press:  28 February 2011

Winnie Wong-Ng ,
Chwan K. Chiang ,
Stephen W. Freiman ,
Lawrence P. Cook ,
Nong M. Hwang  and
Michael D. Hill
Winnie Wong-Ng
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Chwan K. Chiang
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Stephen W. Freiman
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Lawrence P. Cook
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Nong M. Hwang
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
Michael D. Hill
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899.
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Abstract

Phase assemblages in two Sr-Bi-Pb-Ca-Cu-O glasses and their crystallization into glass-ceramics through a sequence of heat treatments are described. Samples were heat treated at various temperatures based on differential thermal analysis (DTA) analysis of the as-quenched glasses. X-ray powder diffraction was used to identify the compounds in each sample; and the different phases formed in these two samples were compared. Results of microstructural characterization of selected samples using scanning electron microscopy are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 123
Copyright
Copyright © Materials Research Society 1990

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References

1 Maeda, H., Tanaka, Y., Fukutomi, M. and Asano, T., Jpn. J. Appl. Phys., 27, L209, (1988).Google Scholar
2 Garzon, F.H., Beery, J.G., and Raistrick, I.D., Appl. Phys. Lett., 53, 805, (1988).Google Scholar
3 Hinks, D.G., Soderholm, L., Capone II, D.W., Dabrowski, B., Mitchell, A.W., Shi, D., Appl. Phys. Lett., 53, 423, (1988).Google Scholar
4 Cava, R., Physica (c) , 153, 560 (1988).Google Scholar
5 Yamada, Y. and Muraase, S., Jpn. J. Appl. Phys., 27, L996, (1988).Google Scholar
6 Shi, D., Boley, M. S., Chen, J.G., Xu, M., Vandervoort, K., Liao, X. Y. and Zangvil, A., Appl. Phys. Lett. 55(7), 14, (1989).Google Scholar
7 Uzumaki, T., Yamanaka, K., Kamehara, N. and Niwa, K., Jap. J. Appl. Phys. 28, L75, (1989).Google Scholar
8 Teske, C. and Muller‐Buschbaum, , Z. Anorg. Allg. Chem. 370, 134 (1969).Google Scholar
9 Roth, R.S., Rawn, C., Burton, B.P. and Beech, F., in preparation, (1989).Google Scholar
10 Wong‐Ng, W., Chiang, C.K., Freiman, S.W., Cook, L.P., Hwang, N.M. and Hill, M.D., submitted to Proceeding of the 1st International Ceramic Science & Technology Congress (1989).Google Scholar