Hostname: page-component-54dcc4c588-ff9ft Total loading time: 0 Render date: 2025-09-11T08:04:16.662Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural Characterisation of Iron-Copper Multilayers Using Transmission Electron Microscopy

Published online by Cambridge University Press:  03 September 2012

S. J. Lloyd ,
R. E. Somekh ,
R.E. Dunin-Borkowski  and
W. M. Stobbs
S. J. Lloyd
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ, U.K.
R. E. Somekh
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ, U.K.
R.E. Dunin-Borkowski
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ, U.K.
W. M. Stobbs
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ, U.K.
Get access

Abstract

Coherent iron-copper multilayers of a wavelength of 2.5nm that were measured to be nonmagnetic were structurally characterised using high resolution and Fresnel techniques. A measurement of the tetragonal distortion from layer to layer and as a whole would allow an assessment of the degree to which the material exhibits any anomaly in its elastic behaviour. The modelling of the distortions requires however the measurement of the abruptness of the interfaces and this requires the quantification of the Fresnel contrast. The degree to which the measurements can be obtained to the required accuracies is considered.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 367: Symposium P – Fractal Aspects of Materials , 1994 , 317
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Baxter, C.S. and Stobbs, W.M., Nature 322, 814 (1986).Google Scholar
2. Tsakalakos, T. and Hilliard, J.E., J. Appl. Phys. 54, 734 (1983).Google Scholar
3. Fullerton, E.E., Schuller, I.K., Parker, F.T., Svinarich, K.A., Eesley, G.L., Bhadra, R. and Grimsditch, M., J. Appl. Phys. 73,7370 (1993)Google Scholar
4. Yoshizaki, F., N. Tanaka and Mihama, K., J. Electron Microsc. 39, 459 (1990).Google Scholar
5. Lu, S.H., Quinn, J., Tian, D., and Jona, F., Surface Science, 209, 364 (1989).Google Scholar
6. Somekh, R.E. and Baxter, C.S., J. Crystal Growth, 76, 119 (1986).Google Scholar
7. Ross, F.M. and Stobbs, W.M., Ultramicroscopy 36, 331 (1991).Google Scholar
8. Baxter, C.S. and Stobbs, W.M., IOPCS (ed: Tatlock, G.W.)(Hilger Bristol)78, 387 (1985).Google Scholar
9. O'Keefe, M. and Spence, J.C.H., Acta Cryst. A 49, 231, (1993)Google Scholar
10. Dunin-Borkowski, R.E., Boothroyd, C.B., Lloyd, S.J. and Stobbs, W.M.. To be presented at CMMP (Warwick, 1994)Google Scholar
11. Treacy, M.M.J., Gibson, J.M. and Howie, A., Phil. Mag. A, 51, 389 (1985).Google Scholar
12. Hall, D.J., Self, P.G. and Stobbs, W.M., J.Microsc. 130, 215 (1983).Google Scholar