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Quantified Comparison of Ordering in Self-Assembled Block Copolymer Films of Different Molecular Weights by Image Analysis Method

Published online by Cambridge University Press:  18 May 2012

Timothy Kehoe ,
Nikolaos Kehagias ,
Worawut Khunsin ,
Dipu Borah ,
Michael Morris  and
Clivia M. Sotomayor Torres
Timothy Kehoe
Affiliation:
Catalan Institute of Nanotechnology CIN2(ICN-CSIC), Campus de la UAB 08193 Bellaterra (Barcelona) Spain.
Nikolaos Kehagias
Affiliation:
Catalan Institute of Nanotechnology CIN2(ICN-CSIC), Campus de la UAB 08193 Bellaterra (Barcelona) Spain.
Worawut Khunsin
Affiliation:
Catalan Institute of Nanotechnology CIN2(ICN-CSIC), Campus de la UAB 08193 Bellaterra (Barcelona) Spain.
Dipu Borah
Affiliation:
Department of Chemistry, University College Cork, Western Road, Cork, Ireland. Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin, Ireland.
Michael Morris
Affiliation:
Department of Chemistry, University College Cork, Western Road, Cork, Ireland. Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin, Ireland. Tyndall National Institute, The Maltings, Cork, Ireland.
Clivia M. Sotomayor Torres
Affiliation:
Catalan Institute of Nanotechnology CIN2(ICN-CSIC), Campus de la UAB 08193 Bellaterra (Barcelona) Spain. Catalan Institute for Research and Advanced Studies (ICREA), 08010 Barcelona, Spain, and Dept of Physics, Universidad Autonoma de Barcelona, Campus UAB, 08193 Bellaterra, Spain.
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Abstract

The order in self-assembled block copolymer films with hexagonal structure is compared using an image analysis method and images taken by scanning electron microscopy and atomic force microscopy. The coordinates of the centres of cylindrical elements in the assembled array are assigned using image analysis software. The method is then used to calculate the amount of elements that symmetrically overlap with another element when mapped through an origin point. Order is compared based on a single numerical value which is dependent on radial distance from the origin and the overlap tolerance value that is assigned. Samples of PS-b-PEO diblock copolymer with a range of molecular weights are compared, and it is found that the degree of ordering achieved is not related to the size of the molecule.

Keywords

self-assemblyfilmmolecular weight
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1412: Symposium FF – Mechanical Nanofabrication, Nanopatterning and Nanoassembly , 2012 , mrsf11-1412-ff01-06
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. International Technology Roadmap for Semiconductors, 2009 Edition, Lithography Chapter Google Scholar
2. Herr, D. J.C., J. Mater. Res. 26, 122–139 (2011)Google Scholar
3. Lithography Chapter, Figure LITH3. Lithography Exposure Tool Potential Solutions, International Technology Roadmap for Semiconductors, 2009 , pp. 1–17. International SEMATECH, Austin, TX, 2009 Google Scholar
4. Park, C., Yoon, J., Thomas, E. L., Polymer 44 (2003) 6725–6760 Google Scholar
5. Farrell, R.A., Petkov, N., Morris, M. A., Holmes, J. D., J. Colloid Interface Sci. 349 449–472 (2010)Google Scholar
6. Amann, A., Khunsin, W., Kocher, G., Sotomayor Torres, C. M., O’Reilly, E. P., Proc. SPIE 6603 660321(2007)Google Scholar