Hostname: page-component-745bb68f8f-cphqk Total loading time: 0 Render date: 2025-02-03T06:33:36.845Z Has data issue: false hasContentIssue false
  • English
  • Français

Modeling Silicon-Based Periodic Waveguides for Optical Interconnects

Published online by Cambridge University Press:  08 January 2013

Meng-Mu Shih
Meng-Mu Shih*
Affiliation:
University of Florida, Gainesville, FL 32611, U.S.A.
Get access

Abstract

To assist the precision and stability of wavelength at 1550 nm and 1300 nm in planar optical waveguides, hybrid semiconductor-metal corrugated gratings with nanometer period are integrated into silicon-based optical interconnects. This work utilizes multi-parametric optical waveguide models to compute the mode-coupling coefficients in the silicon photonic devices. For such a semiconductor-metal hybrid structure, a proper photonic technique needs to be utilized to solve this computational complexity. The optical method and the photonic method are used to compute coupling coefficients. Both methods have close numerical values shown in figures. Numerical results demonstrate how the normalized corrugation amplitudes of metal gratings can affect the coupling coefficients. Further physical interpretation and discussion can support and explain the above results. The modeling results can help engineers decide the values of parameters used in the design and fabrication of optical waveguides.

Keywords

opticalSimetal
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1438: Symposium M – Optical Interconnects—Materials, Performance and Applications , 2012 , mrss12-1438-d01-03
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Zory, P. S. and Comerford, L. D., IEEE J. Quantum Electron., 11(7), 451–457 (1975).CrossRefGoogle Scholar
Hecht, J., Opt. Eng., 49(9), 091002–15 (2010).CrossRefGoogle Scholar
Luo, H. J. and Zory, P. S., IEEE Photonics Tech. Lett., 2(9), 614–616 (1990).CrossRefGoogle Scholar
Wu, M., Han, Z., and Van, V., Optics Express, 18 (11), 11728–11736 (2010).CrossRefGoogle Scholar
http://www.filmetrics.com/refractive-index-database Google Scholar
Johnson, P. B. and Christy, R. W.," Phys. Rev. B6, 4370–4379 (1972).CrossRefGoogle Scholar
Cheng, D. K., Field and Wave Electromagnetics, (Addison-Wesley, 1990), pp. 572–580 Google Scholar
Kogelnik, H. and Shank, C. V., J. Appl. Phys. 43, 2327–2335 (1972).CrossRefGoogle Scholar
Luo, H. J. and Zory, P. S., IEEE J. Quantum Electron., 30(1), 10–14 (1994).CrossRefGoogle Scholar
Yariv, A. and Yeh, P., Photonics: Optics Electronics in Modern Communication, (Oxford University Press, 2007), pp. 575–579.Google Scholar
Shih, M. in SPIE Proceedings of Laser Technology for Defense and Security VII, edited by Dubinskii, M. and Post, S. G., (SPIE Proc. 8039, Bellingham, WA, 2011) pp. 80391B01-06.Google Scholar