Hostname: page-component-745bb68f8f-g4j75 Total loading time: 0 Render date: 2025-02-04T14:09:30.110Z Has data issue: false hasContentIssue false
  • English
  • Français

Micr owave Dielectric Properties of (1-x)CaTiO3-xNd(Mg1/2Ti1/2)O3 Ceramics System

Published online by Cambridge University Press:  01 February 2011

Cheng-Liang Huang ,
Yuan-Bin Chen  and
Ching-Wen Lo
Cheng-Liang Huang
Affiliation:
Department of Electrical Engineering, National Cheng Kung University, 1 University Rd., Tainan 70101, Taiwan
Yuan-Bin Chen
Affiliation:
Department of Electrical Engineering, National Cheng Kung University, 1 University Rd., Tainan 70101, Taiwan
Ching-Wen Lo
Affiliation:
Department of Electrical Engineering, National Cheng Kung University, 1 University Rd., Tainan 70101, Taiwan
Get access

Abstract

The microwave dielectric properties of (1-x)CaTiO3-xNd(Mg1/2Ti1/2)O3 (0.1≤x≤1.0) have been investigated. The system forms a solid solution throughout the entire compositional range. The dielectric constant decreases from 152 to 27 as x varies from 0.1 to 1.0. In the (1-x)CaTiO3-xNd(Mg1/2Ti1/2)O3 system, the microwave dielectric properties can be effectively controlled by varying the x value. A maximum quality factor Qxf=43000GHz (where f is the resonant frequency) was achieved for samples with x=0.9, although the dielectric properties varied with sintering temperature. The Qxf value of (1-x)CaTiO3-xNd(Mg1/2Ti1/2)O3 almost increased up to 1500°C, after which it decreased. At 1400°C, 0.1CaTiO3-0.9Nd(Mg1/2Ti1/2)O3 ceramics gives a dielectric constant εr of 42, a Qxf value of 35000 (GHz) and a τf value of -10 (ppm/°C).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 783: Symposium B – Materials, Intergration, and Packaging Issues for High-Frequency Devices , 2003 , B5.13
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Solomon, S., Sreemoolanadhan, H., Sebastian, M.T., Mohanan, P., Mater. Lett. 28 (1996) 107.Google Scholar
2. Takata, M., Kagayeman, K., J. Am. Ceram. Soc. 72(1989) 1995.Google Scholar
3. Sreemoolanadhan, H., Ratheesh, R., Sebastian, M.T., Mohanan, P., Mater. Lett. 33 (1997) 161.Google Scholar
4. Kajfez, D., Guillon, P., Dielectric Resonators, Artech House, Massachusettls, 1986.Google Scholar
5. Harshe, G., Bhalla, A.S., Cross, L.E., Mater. Lett 18 (1994)Google Scholar
6. Cho, S.Y., Seo, M.K., Hong, K.S., Park, S.J., I.T. kim. Mater. Res. Bull. 32(1997) 725.Google Scholar
7. Cho, S.Y., Kim, C.H., Hong, K.S., Kim, J.H., J. Mater. Res 14 (1999) 2484.Google Scholar