Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Freer Goldstein, J. L.
and
Morris, J. W.
1994.
The effect of substrate on the microstructure and creep of eutectic In-Sn.
Metallurgical and Materials Transactions A,
Vol. 25,
Issue. 12,
p.
2715.
Basaran, C.
and
Chandaroy, R.
1997.
Finite element simulation of the temperature cycling tests.
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A,
Vol. 20,
Issue. 4,
p.
530.
Basaran, C.
Desai, C. S.
and
Kundu, T.
1998.
Thermomechanical Finite Element Analysis of Problems in Electronic Packaging Using the Disturbed State Concept: Part 1—Theory and Formulation.
Journal of Electronic Packaging,
Vol. 120,
Issue. 1,
p.
41.
Chandaroy, R.
and
Basaran, C.
1999.
Damage Mechanics of Surface Mount Technology Solder Joints Under Concurrent Thermal and Dynamic Loading.
Journal of Electronic Packaging,
Vol. 121,
Issue. 2,
p.
61.
Basaran, Cemal
and
Chandaroy, Rumpa
2000.
Using finite element analysis for simulation of reliability tests on solder joints in microelectronic packaging.
Computers & Structures,
Vol. 74,
Issue. 2,
p.
215.