Published online by Cambridge University Press: 15 February 2011
A low heat-capacitance substrate has been introduced to lateral grain-growth for Si thin-films. Grains as large as 13μm could be fabricated by irradiation of a single shot of an excimer-laser light pulse with intensity gradient. The film has an orientation in the (110) direction, different from (111) for the conventional excimer-laser-annealed film, and is applicable to a seed layer for solid-phase epitaxial-growth aiming at solar cell application.
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