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Light-Induced Degradation and Annealing Behaviour of Amorphous Silicon: A Comparison of Films and Devices

Published online by Cambridge University Press:  26 February 2011

M. S. Bennett ,
S. Wiedeman ,
K. Rajan  and
M. Smoot
M. S. Bennett
Affiliation:
Solarex Corporation, 826 Newtown-Yardley Road, Newtown, PA 18940 USA
S. Wiedeman
Affiliation:
Solarex Corporation, 826 Newtown-Yardley Road, Newtown, PA 18940 USA
K. Rajan
Affiliation:
Solarex Corporation, 826 Newtown-Yardley Road, Newtown, PA 18940 USA
M. Smoot
Affiliation:
Solarex Corporation, 826 Newtown-Yardley Road, Newtown, PA 18940 USA
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Abstract

The kinetics of the Staebler-Wronski effect in a-Si:H p-i-n solar cells are well known [1]. We report measurements of the kinetics of light-induced degradation and annealing of a-Si films in which we have monitored the changes in subgap absorption by means of photothermal deflection spectroscopy (PDS). The kinetics of films and cells are found to be very similar, suggesting that cell degradation is largely a material, as opposed to a device effect.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 95: Symposium E – Amorphous Silicon Semiconductors--Pure and Hydrogenated , 1987 , 601
Copyright
Copyright © Materials Research Society 1987

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References

1. Bennett, M.S., Newton, J.L. and Rajan, K., in Proc. of the 18th IEEE PV Specialists Conf. (Las Vegas, 1985) p. 1584.Google Scholar
2. Bennett, M.S., Newton, J.L. and Rajan, K., in Proc. of the 7th EC PV Solar Energy Conf. (Seville, 1986) p. 544.Google Scholar
3. Stutzmann, M., Jackson, W.B. and Tsai, C.C., Phys. Rev. B32, 23 (1985).Google Scholar
4. Lee, C., Ohlsen, W.D., Taylor, P.C., Ullal, H.S., and Caesar, G.P., Phys. Rev. B31, 100 (1985).Google Scholar
5. Bennett, M.S., Wiedeman, S., Newton, J.L., and Rajan, K., in Mat. Res. Soc. Symp. Proc. Vol. 94, edited by Adler, D., Madan, A., Thompson, M., and Hamakawa, Y. (MRS, Pittsburg, 1987) (to be published).Google Scholar
6. Wiedeman, S., Bennett, M.S., Newton, J.L. in Mat. Res. Soc. Symp. Proc. Vol. 94, edited by Adler, D., Madan, A., Thompson, M., and Hamakawa, Y.(MRS, Pittsburg, 1987) (to be published).Google Scholar