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Investigation Of YBa2Cu3O7-δ Films Grown on Vicinally-Polished MgOSubstrates

Published online by Cambridge University Press:  26 February 2011

S. K. Streiffer ,
B. M. Lairson  and
J. C. Bravman
S. K. Streiffer
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
B. M. Lairson
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
J. C. Bravman
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
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Abstract

X-ray diffraction and transmission electron microscopy have been used to study the morphology and defect structure of YBa2Cu3O7-δ films on [001] MgO substrates polished away from the [001] crystallographic axis towards either [010] or [110] by angles ranging from 1° to 20°. On the [010] off-axis substrates it was found that growth of the YBCO film was highly influenced by the surface normal of the substrate with only very weak alignment to the substrate [001] direction. All [010]-angled samples maintained Tc's of 86K. Angles of 1°, 2.5°, and 5° toward [010] produced films with large mosaic spread parallel to the direction of the angle, as high as 4° FWHM for the 5° sample. Critical current densities of these films remained as high as those of films grown on on-axis substrates, e.g. 4.4×107 A/cm2 at 4.2 K and zero applied field. Larger off-axis angles led to samples with reduced mosaic spread but still alignment to the surface normal, and reduced Jc's of 2×107 A/cm2 and 1×l05 A/cm2 for 10° and 20° angles, respectively. TEM investigation and in-plane x-ray examination of the 5°, 10°, and 20° samples show good in-plane texture except for the 20° sample, and increased granularity with angle. Films on substrates polished off-axis towards [110] have degraded Tc's and Jc's for all angles.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 777
Copyright
Copyright © Materials Research Society 1991

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References

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