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The Importance of Thickness to the Crystallization of Amorphous thin Films

Published online by Cambridge University Press:  21 February 2011

Gregory F. Cardinale ,
S. N. Farrens  and
D. G. Howitt
Gregory F. Cardinale
Affiliation:
Department of Mechanical Aeronautical and Materials Engineering, University of California at Davis, California 95616
S. N. Farrens
Affiliation:
Department of Mechanical Aeronautical and Materials Engineering, University of California at Davis, California 95616
D. G. Howitt
Affiliation:
Department of Mechanical Aeronautical and Materials Engineering, University of California at Davis, California 95616
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Abstract

The crystallization of an amorphous thin film, when it is annealed, can be described in terms of the latent heat of the transformation and an activation energy which depends upon the configurational entropy of the surface of the crystallizing interface. An expression is derived for anatase, the low temperature form of titanium oxide, which is consistent with the growth that is observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991 , 643
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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