Hostname: page-component-7dd5485656-zklqj Total loading time: 0 Render date: 2025-10-30T15:17:24.682Z Has data issue: false hasContentIssue false
  • English
  • Français

Formation of a Ni3O4 Spinel Phase on the Surface of NiO During Electron Irradiation

Published online by Cambridge University Press:  25 February 2011

Mary I. Buckett  and
L. D. Marks
Mary I. Buckett
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
L. D. Marks
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
Get access

Abstract

Structural changes occurring at the surface of NiO during electron irradiation were examined in-situ with a variable voltage high resolution electron microscope. The interaction of the specimen with the electron beam was found to be highly dependent on the state of the surface prior to irradiation. It was observed that by varying the sample preparation conditions, the Ni on the surface of NiO could either be oxidized to Ni304 spinel phase or reduced to islands of metallic Ni. The formation of the Ni3O4 spinel phase is in agreement with previous surface science studies, where chemical shift information identified the presence of Ni3+ species at the surface. This has previously been interpreted as the formation of Ni203

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Hobbs, L. W., Ch. 11 in Quantitative Electron Microscopy ed: Chapman, J. N. and Craven, A. J., SUSSP Publications, Edinburgh (1984).Google Scholar
2. Buckett, M.I. et al. , Ultramicroscopy (in press).Google Scholar
3. Madden, H.H., J. Vacuum Sci. Technol. 13, 228 (1976)Google Scholar
4. Gerritsen, H.C. et al. , Surface Sci. 139, 16 (1984)CrossRefGoogle Scholar
5. Niehus, H. and Losch, W., Surface Sci. 111,344 (1981).CrossRefGoogle Scholar
6. Knotek, M.L. and Feibelman, P.J., Phys. Rev. Letters 40, 41, 964 (1978)CrossRefGoogle Scholar
7. Smith, D. J., McCartney, M. R., and Bursill, L. A., Ultramicroscopy 23, 299 (1987)Google Scholar
8. Fan, H., Marks, L.D., Northwestern University, to be published.Google Scholar
9. Buckett, M.I., Singh, S., Marks, L.D., Northwestern University, to be published.Google Scholar
10. Kim, K.S. and Winograd, N., Surface Science 43, 62 (1974)Google Scholar
11. Suzuki, T. et al. , J. Phys. Soc. Vol, 30 888, (1971).CrossRefGoogle Scholar
12. Luzzi, D.E. et al. , Mat. Res. Soc. Symp. Proc. Vol.100, 635 (1988)Google Scholar
13. Smith, D.J. et al. , Surface Science 175, 673 (1986)CrossRefGoogle Scholar
14. Ostyn, K.M. and Carter, C.B., Electron Microscopy 1982, Vol. 2, p.191.Google Scholar
15. Uu, J. and Cowley, J.M., Proc. of EMSA, 176 (1987).Google Scholar