Hostname: page-component-745bb68f8f-l4dxg Total loading time: 0 Render date: 2025-01-12T02:01:52.676Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of crystallization on Adhesion Strength of External Electrode in LTCC

Published online by Cambridge University Press:  26 February 2011

Minji Ko ,
SooHyun Lyoo ,
Yongseok Choi ,
Hyungho Kim ,
Hosung Choo ,
Beomjoon Cho  and
EunTae Park
Minji Ko
Affiliation:
minji.ko@samsung.com, Samsung electro-mechanics, Electronic Materials & Devices Lab (LTCC), 314, Maetan3-Dong, Yeongtong-Gu, Suwon, 443-743, Korea, Republic of, 82-31-210-6169, 82-31-300-7900
SooHyun Lyoo
Affiliation:
soohyun.lyoo@samsung.com, SAMSUNG ELECTRO-MECHANICS, Electronic Materials & Devices Lab (LTCC), 314, Maetan3-Dong, Yeongtong-Gu, Suwon, 443-743, Korea, Republic of
Yongseok Choi
Affiliation:
yongseok@samsung.com, SAMSUNG ELECTRO-MECHANICS, Electronic Materials & Devices Lab (LTCC), 314, Maetan3-Dong, Yeongtong-Gu, Suwon, 443-743, Korea, Republic of
Hyungho Kim
Affiliation:
since70.kim@samsung.com, SAMSUNG ELECTRO-MECHANICS, Electronic Materials & Devices Lab (LTCC), 314, Maetan3-Dong, Yeongtong-Gu, Suwon, 443-743, Korea, Republic of
Hosung Choo
Affiliation:
hs.choo@samsung.com, SAMSUNG ELECTRO-MECHANICS, Electronic Materials & Devices Lab (LTCC), 314, Maetan3-Dong, Yeongtong-Gu, Suwon, 443-743, Korea, Republic of
Beomjoon Cho
Affiliation:
dandycho@samsung.com, SAMSUNG ELECTRO-MECHANICS, Electronic Materials & Devices Lab (LTCC), 314, Maetan3-Dong, Yeongtong-Gu, Suwon, 443-743, Korea, Republic of
EunTae Park
Affiliation:
et.park@samsung.com, SAMSUNG ELECTRO-MECHANICS, Electronic Materials & Devices Lab (LTCC), 314, Maetan3-Dong, Yeongtong-Gu, Suwon, 443-743, Korea, Republic of
Get access

Abstract

A mixture system of MO-SiO2 (M: Ca, Sr, Ba) glass and Al2O3 crystalline powder has been investigated as a substrate material for low temperature co-fired ceramics (LTCC). This type of glass-ceramic mixture is known to be crystallized during the sintering process. We found that the adhesion strength of external electrode was strongly related with sintering condition. Crystallization behavior was monitored by means of powder X-ray diffraction (XRD). The microstructure of sintered body after electroless plating was examined by Scanning Electron Microscopy (SEM). It was observed that the degree of crystallization was strongly affected by sintering condition. We focused ourselves on elucidating the relationship between the degree of crystallization and the adhesion strength of external electrode that was made by means of electroless plating.

Keywords

adhesioncrystallinesintering
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 968: Symposium V – Advanced Electronic Packaging , 2006 , 0968-V07-11
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Krzmanc, M. M., Valant, M., Jancar, B., Suvorov, D., J. Am. Ceram. Soc., 88 [9] 2472–2479, (2005)Google Scholar
[2] Lo, C., Duh, J., Chiou, B., Lee, W., J. Am. Ceram. Soc., 85[9] 2230–2235, (2002)Google Scholar
[3] Mohanram, A., Messing, G. L., Green, D. J., J. Am. Ceram. Soc., 88 [10] 2681–2689, (2005)Google Scholar
[4] Carbajal, Juan Rodriguez, “Fullprof2000”, (2000)Google Scholar
[5] Roisenel, T., Carbajal, J. R., “WinplotR”, (2001)Google Scholar
[6] Lo, C. L., Duh, J. G., Chiou, B.S. and Lee, W. H., Mater. Res. Bull., 37, 1949∼60 (2002)Google Scholar
[7] Suvorov, D., Valant, M., J. Ceram. Soc. Japan, 112[5] S1557∼S1562 (2004)Google Scholar
[8] Young, R. A., “The Rietveld Method,” IUCR, Oxford science publication (1993)Google Scholar
[9] Pecharski, V. K. and Zavalij, P. Y., “Fundamental of powder diffraction and structural characterization of material,” Kluwer Academic Press (2003)Google Scholar
[10] Jenkins, R. and Snyder, R. L., “Introduction to X-ray powder diffractometry,” John Wiley & Sons, Inc. (1996)Google Scholar