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Dimpling of Cadmium Telluride Samples for Transmission Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

Michael E. Lee ,
E. O. de Neijs  and
A. M. Letsoalo
Michael E. Lee
Affiliation:
Electron Microscope Unit, University of the North, Private Bag X1106 Sovenga 0727, Republic of South Africa
A. M. Letsoalo
Affiliation:
Department of Physics, University of the North, Private Bag X1106 Sovenga 0727, Republic of South Africa
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Abstract

A technique for preparing thin sections in CdTe samples for transmission electron microscopy by a method of mechanical dimpling combined with chemical etching has been investigated. The dimpling rates and surface morphologies of dimpled (100) CdTe samples as a function of pressure, abrasive size and viscosity are presented. This technique produces dimpled samples of well controlled geometries and surface morphologies and offers the advantage of a high dimpling rate and the precise determination of the dimple position. The disadvantage of this technique is that a final application of chemical etching or atom milling is still required to produce electron thin sections.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 193
Copyright
Copyright © Materials Research Society 1988

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References

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