Hostname: page-component-745bb68f8f-mzp66 Total loading time: 0 Render date: 2025-02-04T14:31:58.340Z Has data issue: false hasContentIssue false
  • English
  • Français

Converting Films for X-Ray Detectors, Applied to Amorphous Silicon Arrays.

Published online by Cambridge University Press:  10 February 2011

S. Ross  and
G. Zentai
S. Ross
Affiliation:
Argonne National Laboratory, Argonne IL 60439skross@anl.gov
G. Zentai
Affiliation:
Currently with Optical Imaging Systems, Inc., Northville MI 48167.
Get access

Abstract

This paper presents results from our on-going efforts to characterize semiconductor thin films for direct x-ray conversion. We deposit these thin films onto an amorphous silicon (a-Si:H) readout array with the overall goal of developing a large area x-ray detector for protein crystallography, and for other x-ray imaging fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 393
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)