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Analyses of Creep Pores in Liquid-Phase-Sintered Alumina by Means of Joint Use of Conventional and High-Resolution Sans

Published online by Cambridge University Press:  22 February 2011

M. Klatt ,
D. Bellmann ,
R. Kampmann ,
R. Wagner ,
C. Wolf  and
H. HÜbner
M. Klatt
Affiliation:
GKSS Forschungszentrum Geesthacht GmbH, 21502 Geesthacht, Germany
D. Bellmann
Affiliation:
GKSS Forschungszentrum Geesthacht GmbH, 21502 Geesthacht, Germany
R. Kampmann
Affiliation:
GKSS Forschungszentrum Geesthacht GmbH, 21502 Geesthacht, Germany
R. Wagner
Affiliation:
GKSS Forschungszentrum Geesthacht GmbH, 21502 Geesthacht, Germany
C. Wolf
Affiliation:
Technische Universitat Hamburg-Harburg, 21071 Hamburg, Germany
H. HÜbner
Affiliation:
Technische Universitat Hamburg-Harburg, 21071 Hamburg, Germany
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Abstract

Failure of ceramic materials for high-temperature applications is initiated by the formation of creep pores. Thus, the determination of the sizes and number densities of pores induced during creep testing is one key to a understanding of their failure mechanisms and related life-time predictions. For this purpose small-angle neutron scattering (SANS) techniques are one of the most potential tools as demonstrated by an analysis of creep pores in liquid-phase-sintered, hot isostatically pressed alumina. The exploration of creep induced pores requires the analysis of SANS intensity over an extremely extended region of scattering vectors, the scanning of which needs joint use of both conventional SANS and double crystal diffractometry (DCD), an ultra small angle scattering technique.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 376: Symposium BB – Neutron Scattering in Materials Science , 1994 , 365
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1 Tsai, R. L. and Raj, R., Acta Metall., 30 (1982) 1043 Google Scholar
2 Hübner, H. and Stark, J.. In Vincenzini, P., editor, High Tech Ceramics (Materials Science Monographs, 38 B), 1247 - 1257, Elsevier, Amsterdam, 1987 Google Scholar
3 Clarke, D. R., J. Mater. Sci., 20 (1985) 1321 Google Scholar
4 Page, R.A., J. Appl. Cryst., 21 (1988) 795 Google Scholar
5 Page, R.A., Lankford, J., Chan, K.S., Hardman-Rhyne, K., Spooner, S., J. Am. Ceram. Soc, 70 (1987)137 Google Scholar
6 Chan, K. S., Lankford, J., Page, R.A., Acta Metall., 32 (1984) 1907 Google Scholar
7 Guinier, A., Fournet, G., Small-Angle Scattering of X-rays, (John Wiley & Sons, New York, 1955), p. 114 Google Scholar
8 Dang, M.C., Baudelet, B., J. Mater. Sci, 29 (1994) 2315 Google Scholar