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Ab-Initio Study of the Local Bonding at Metal-Ceramic Heterophase Boundaries

Published online by Cambridge University Press:  10 February 2011

S. Köstlmeier  and
C. Elsässer
S. Köstlmeier
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174 Stuttgart, Germany. Scuola Internazionale Superiore di Studi Avanzati, Via Beirut 2–4, I–34014 Trieste, Italy.
C. Elsässer
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174 Stuttgart, Germany.
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Abstract

The adhesion geometries of the (100) heterophase boundaries between the metals Al or Ag and spinel (MgAl2O4) were determined by density-functional calculations employing a mixed-basis pseudopotential method. The results compare well with high-resolution transmission-electronmicroscopy studies which were carried out in parallel. An analysis of the calculated electronic structures shows that the strong adhesion of Al on spinel is mediated by directional bonding. The comparatively weak interaction of spinel with Ag is dominated by polarization effects which can be classified as originating from an image-charge interaction. Additionally, the effects of changes in stoichiometry and of segregated substitutional atoms at the interface were analyzed in terms of the excess of the corresponding component at the interface. The implications for the geometric structure and the related mechanical properties at the metal-ceramic junctions are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 586: Symposium M – Interfacial Engineering for Optimized Properties II , 1999 , 43
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

[1] Schweinfest, R., Ernst, F., Wagner, T., and Rifihle, M, J. Microsc., 194, 142, (1999).10.1046/j.1365-2818.1999.00465.xGoogle Scholar
[2] Köstlmeier, S., Elsässer, C., Meyer, B., and Finnis, M. W., phys. stat. sol. (a) 166 417 (1998).Google Scholar
[3] Köstlmeier, S., Elsässer, C., Meyer, B., and Finnis, M. W., Mat. Res. Symp. Proc. Vol.492, 97 (1998); S. Köstlmeier and C. Elsässer, Interface Science, in press.10.1557/PROC-492-97Google Scholar
[4] Köstlmeier, S. and Elsässer, C., J. Phys.: Condens. Matter, in press.Google Scholar
[5] Bischof, J., Scherer, D., Herminghaus, S., and Leiderer, P., Phys. Rev. Lett 77, 1536 (1996).Google Scholar
[6] Kasowski, R. V., Ohnuchi, F. S., and French, R. H., Physica B 150, 44 (1988); K. Nath and A. B. Anderson, Phys. Rev. B 39, 1013 (1989); P. Alemany, R. S. Boorse, J. M. Burlitch, and R. Hoffmann, J. Phys. Chem 97, 8464 (1993); G. L. Zhao, J. R. Smith, J. Raynolds, and D. J.Srolovitz, Interface Science 3, 289 (1997).Google Scholar
[7] Guo, Q. and Møller, P. J., Surf. Sci. 244, 228 (1991); M. Gautier, L. Pham-Van and J. P.Durand, Europhys. Letters 18, 175 (1992); C. Scheu, G. Dehm, H. Müllejans, R. Brydson, and M.Rahle, Microsc. Microanal. Microstruct. 6, 19 (1995); G. Dehm, C. Scheu, G. Möbus, R. Brydson, and M. Ruhle, Ultramicroscopy 67, 207 (1997).10.1016/0039-6028(91)90496-FGoogle Scholar
[8] Feibelman, P. J., Appelbaum, J. A., and Hamann, D. R., Phys. Rev. B 20, 1433 (1979).Google Scholar
[9] Hohenberg, P. and Kohn, W., Phys. Rev. 136, B864 (1964); W. Kohn and L. J. Sham, Phys. Rev. 140, A1133 (1965).Google Scholar
[10] Louie, S. G., Ho, K.-M. and Cohen, M. L., Phys. Rev. B 19, 1774 (1979); C. Elsösser, N. Takeuchi, K. M. Ho, C. T. Chan, P. Braun and M. Föhnle, J. Phys.: Condens. Matter 2, 4371 (1990); K. M. Ho, C. Elsöser, C. T. Chan and M. Föhnle, J. Phys.: Condens. Matter 4, 5189 (1992); B. Meyer, C. Elsösser and M. Föhnle, Fortran90 Program for Mixed-Basis Pseudopotential Calculations for Crystals (MPI für Metallforschung Stuttgart, unpublished).10.1103/PhysRevB.19.1774Google Scholar
[11] Vanderbilt, D., Phys. Rev. B 32, 8412 (1985).Google Scholar
[12] Monkhorst, H. and Pack, J. D., Phys. Rev. B, 8, 5747, (1978).Google Scholar