Hostname: page-component-745bb68f8f-l4dxg Total loading time: 0 Render date: 2025-01-12T05:30:11.485Z Has data issue: false hasContentIssue false
  • English
  • Français

5MeV Si Ion Modification on Thermoelectric SiO2/SiO2+Cu Multilayer Films

Published online by Cambridge University Press:  31 August 2011

C. Smith ,
S. Budak ,
T. Jordan ,
J. Chacha ,
B. Chhay ,
K. Heidary ,
R. B. Johnson ,
C. Muntele  and
D. ILA
C. Smith*
Affiliation:
Center for Irradiation of Materials, Alabama A&M University, Normal, AL USA
S. Budak
Affiliation:
Center for Irradiation of Materials, Alabama A&M University, Normal, AL USA
T. Jordan
Affiliation:
Department of Electrical Engineering, Alabama A&M University, Normal, AL USA
J. Chacha
Affiliation:
Department of Electrical Engineering, Alabama A&M University, Normal, AL USA
B. Chhay
Affiliation:
Department of Physics, Alabama A&M University, Normal, AL USA
K. Heidary
Affiliation:
Department of Electrical Engineering, Alabama A&M University, Normal, AL USA
R. B. Johnson
Affiliation:
Department of Physics, Alabama A&M University, Normal, AL USA
C. Muntele
Affiliation:
Center for Irradiation of Materials, Alabama A&M University, Normal, AL USA
D. ILA
Affiliation:
Department of Physics, Fayetteville St. University, Fayetteville, NC USA
*
*Corresponding author: C. Smith; Tel.: 256-372-5866; Fax: 256-372-5855; Email: cydale.smith@cim.aamu.edu
Get access

Abstract

We prepared samples by electron beam physical vapor deposition EB-PVD followed by ion bombardment. The samples were than characterized by photoluminescence (PL), x-ray photoelectron spectroscopy (XPS). PL was used to characterize the available energy states. XPS was used to determine the binding energies. The ML’s are comprised of 100 alternating layers of SiO2/SiO2+Cu.

Keywords

ion-beam processingnanostructureoptical properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1354: Symposium II – Ion Beams—New Applications from Mesoscale to Nanoscale , 2011 , mrss11-1354-ii07-01
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chang, L. L., Esaki, L., and TSu, R., Appl. Phys. Lett. 24, 593 (1974)10.1063/1.1655067Google Scholar
2. Arik, Mehmet, Bray, Jim, and Weaver, Stanton, Proc. of SPIE Vol. 7679 (2010) 76791F-1-18.Google Scholar
3. Xiong, Zhen, Chen, Xihong, Zhao, Xueying, Bai, Shengqiang, Huang, Xiangyang, Chen, Lidong, Solid State Sciences 11 (2009) 1612–1616.10.1016/j.solidstatesciences.2009.06.007Google Scholar
4. Li, Tao, Tang, Guangfa, Gong, Gauangcai, Zhang, Guangqiang, Li, Nianping, Zhang, Lin, Applied Thermal Engineering 29 (2009) 2016–2021.10.1016/j.applthermaleng.2008.10.007Google Scholar
5. Harman, T. C., Taylor, P.J., Walsh, M.P., LaForge, B.E., Science 297(2002) 2229–2232.10.1126/science.1072886Google Scholar
6. Liu, J.L., Khitun, A., Wang, K.L., Borca-Tasiuc, T., Liu, W.L., Chen, G., Yu, D.P., Journal of Crystal Growth 227-228 (2001) 1111–1115.10.1016/S0022-0248(01)00998-8Google Scholar
7. Slack, G., in CRC Handbook of Thermoelectrics (Ed: Rowe, D.M.), CRC Press (1995) pp. 407–440.Google Scholar
8. Trit, T.M., Ed., Semiconductor and Semimetals 71 (2001)Google Scholar
9. Cheng, Chin-Hsiang, Huang, Shu-Yu, Cheng, Tsung-Chieh, International Journal of Heat and Mass Transfer 53 (2010) 2001–2011.10.1016/j.ijheatmasstransfer.2009.12.056Google Scholar
10. Zheng, B., Budak, S., Muntele, C., Xiao, Z., Celaschi, C., Muntele, I., Chhay, B., Zimmerman, R.L., Holland, L.R., Ila, D., Materials in Extreme Environments, Materials Research Society, vol. 929, 2006, p. 81.Google Scholar
11. Budak, S., Muntele, C., Zheng, B., Ila, D., Nuc. Instr. and Meth. B 261 (2007) 1167.10.1016/j.nimb.2007.03.049Google Scholar
12. Guner, S., Budak, S., Minamisawa, R. A., Muntele, C., Ila, D., Nuc. Instr. and Meth. B 266 (2008) 1261.10.1016/j.nimb.2008.01.045Google Scholar
13. Budak, S., Guner, S., Minamisawa, R. A., and ILA, D., Surface and Coating Technology 203 (2009) 2479–2481.10.1016/j.surfcoat.2009.02.041Google Scholar
14. Chacha, J., Budak, S., Smith, C., Pugh, M., Ogbara, K., Heidary, K., Johnson, R. B., Muntele, C., ILA, D., Mater. Res. Soc. Symp. Proc. Vol. 1267 © 2010 Materials Research Society 1267-DD05-15.10.1557/PROC-1267-DD05-15Google Scholar
15. Umeda, N., Kishimoto, N., Takeda, Y., Lee, C.G., Gritsyna, V.T., Nucl. Instrum. Methods B 166–167 (2000) 864.Google Scholar