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3-D Measurement of Deformation Microstructure in Al(0.2%)Mg Using Submicron Resolution White x-ray Microbeams

Published online by Cambridge University Press:  10 February 2011

B.C. Larson ,
N. Tamura ,
J.-S. Chung ,
G.E. Ice ,
J. D. Budai ,
J. Z. Tischler ,
W. Yang ,
H. Weiland  and
W.P. Lowe
B.C. Larson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
N. Tamura
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
J.-S. Chung
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
G.E. Ice
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
J. D. Budai
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
J. Z. Tischler
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
W. Yang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
H. Weiland
Affiliation:
Alcoa Technical Center, Alcoa Center, PA
W.P. Lowe
Affiliation:
Howard University, Washington D.C.
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Abstract

We have used submicron-resolution white x-ray microbeanis on the MHATT-CAT beamline 7-ID at the Advanced Photon Source to develop techniques for three-dimensional investigation of the deformation microstructure in a 20% plane strain compressed Al(0.2%)Mg tri-crystal. Kirkpatrick-Baez mirrors were used to focus white radiation from an undulator to a 0.7 × 0.7 μm2 beam that was scanned over bi- and tri-crystal regions near the triple-junction of the tricrystal. Depth resolution along the x-ray microbeam of less than 5 microns was achieved by triangulation to the diffraction source point using images taken at a series of CCD distances from the microbeam. Computer indexing of the deformation cell structure in the bi-crystal region provided orientations of individual subgrains to ∼0.01°, making possible detailed measurements of the rotation axes between individual cells.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 247
Copyright
Copyright © Materials Research Society 2000

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References

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