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Effect of the ligand in the crystal structure of zinc oxide: an x-ray powder diffraction, x-ray absorption near-edge structure, and an extended x-ray absorption fine structure study

Published online by Cambridge University Press:  20 April 2016

María de los A. Cepeda-Pérez ,
Cristina M. Reyes-Marte ,
Valerie Ann Carrasquillo ,
William A. Muñiz ,
Edgar J. Trujillo ,
Rahul Singhal ,
Harry Rivera  and
Mitk'El B. Santiago-Berríos
María de los A. Cepeda-Pérez
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Cristina M. Reyes-Marte
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Valerie Ann Carrasquillo
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
William A. Muñiz
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Edgar J. Trujillo
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Rahul Singhal
Affiliation:
Department of Physics and Engineering Physics, Central Connecticut State University, New Britain, CT-06050
Harry Rivera
Affiliation:
Inter American University of Puerto Rico, Bayamón Campus, Carr 500 Dr John W. Harris, Bayamón 00957, Puerto Rico
Mitk'El B. Santiago-Berríos*
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
*
Address all correspondence to Mitk'El B. Santiago-Berríos at msantiago326@suagm.edu
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Abstract

We analyze the effect of functionalization in the surface of zinc oxide crystal structure by 3-mercaptopropionic acid. X-ray powder diffraction data and extended x-ray absorption fine structure studies confirms a wurtzite structure. However, the morphology of the surface seems to be reduced and shows a film-like surface as demonstrated by x-ray absorption near edge structure and scanning electron microscopy. As a result of surface functionalization, the energy levels of the semiconductor were shifted toward reductive potentials (by 50 mV) as determined by diffuse reflectance and cyclic voltammetry.

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Type
Research Letters
Information
MRS Communications , Volume 6 , Issue 2 , June 2016 , pp. 93 - 97
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Copyright
Copyright © Materials Research Society 2016 

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