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Lifetime limitations in organic electronic devices due to metal electrochemical migration

Published online by Cambridge University Press:  19 July 2017

Robert Abbel ,
Linda van de Peppel ,
Gerwin Kirchner ,
Jasper J. Michels  and
Pim Groen
Robert Abbel
Affiliation:
Holst Centre – TNO, High Tech Campus 31, 5656 AE Eindhoven, The Netherlands
Linda van de Peppel
Affiliation:
Holst Centre – TNO, High Tech Campus 31, 5656 AE Eindhoven, The Netherlands
Gerwin Kirchner
Affiliation:
Holst Centre – TNO, High Tech Campus 31, 5656 AE Eindhoven, The Netherlands
Jasper J. Michels*
Affiliation:
Max Plack Institut für Polymerenforschung, Ackermannweg 10, 55128 Mainz, Germany
Pim Groen*
Affiliation:
Holst Centre – TNO, High Tech Campus 31, 5656 AE Eindhoven, The Netherlands Delft University of Technology, Faculty of Aerospace Engineering, Kluyverweg 1, 2629 HS Delft, The Netherlands
*
Address all correspondence to Pim Groen, Jasper J. Michels at pim.groen@tno.nl, michels@mpip-mainz.mpg.de
Address all correspondence to Pim Groen, Jasper J. Michels at pim.groen@tno.nl, michels@mpip-mainz.mpg.de
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Abstract

Operational lifetime is a critical performance parameter of organic electronic devices and can be cut short by multiple degradation mechanisms. One supposed cause is metal migration between the electrodes, which, however, is difficult to study independently of other failure modes. We present a setup, which excludes such competing processes and demonstrates that silver (Ag) electrochemical migration through organic optoelectronic materials occurs predominantly by cation transport. Metal dendrites form at the cathode, eventually causing short circuits between the electrodes. Lifetime studies with organic light-emitting diodes containing Ag electrodes suggest that results obtained with our setup can provide relevant information about degradation in real devices.

Type
Research Letters
Information
MRS Communications , Volume 7 , Issue 3 , September 2017 , pp. 664 - 671
Copyright
Copyright © Materials Research Society 2017 

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