Young-Chang Joo on mechanical properties of flexible electronics

Young-Chang Joo of Seoul National University, in an interview with MRS Bulletin editor Gopal R. Rao, discusses reliability issues for flexible electronics as compared to conventional electronics, and materials research needed to improve the reliability of flexible devices. He covers reliability for mechanical fatigue and whether international standards are currently under consideration for flexible devices. He also talks about methods for improving long-term reliability of flexible electronic devices using nanostructures such as nanoholes, nanopores, nanowires, and multilayer structures.