Hostname: page-component-54dcc4c588-2bdfx Total loading time: 0 Render date: 2025-10-06T03:07:32.220Z Has data issue: false hasContentIssue false
  • English
  • Français

Metallic Superlattices: The Study of Materials at Length Scales From a Few to Hundreds of Angstroms

Published online by Cambridge University Press:  29 November 2013

Ivan K. Schuller  and
H. Homma
Get access

Abstract

We present the possibilities that metallic superlattices offer for the study of materials at length scales ranging from a few to hundreds of angstroms. The materials problems being studied span practically all interesting solid-state phenomena, including superconductivity, magnetism, elastic behavior, development of novel materials, diffusion, ion beam mixing, crystallization, and amorphization. Several applications are also being pursued. We present a few examples of problems that can be studied at different length scales. Emphasis is made that for a proper study of materials properties, extensive structural characterization is imperative.

Information

Type
Technical Features
Information
MRS Bulletin , Volume 12 , Issue 3 , May 1987 , pp. 18 - 23
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1.Synthetic Modulated Structures, edited by Chang, L.L. and Giessen, B.C., (Academic Press, New York, 1985).Google Scholar
2.Epitaxial Growth, edited by Matthews, J.W., (Academic Press, New York, 1975).Google Scholar
3.Interfaces, Superlattices, and Thin Films, edited by Dow, J.D. and Schuller, I.K., (Materials Research Society, Pittsburgh, 1987) (in press).Google Scholar
4.DuMond, J. and Youtz, J.P., J. Appl. Phys. 11 (1940) p. 357.CrossRefGoogle Scholar
5.Durbin, S.M., Cunningham, J.E., Mochel, M.F., and Flynn, C.P., J. Phys. F11 (1981) p. L223.CrossRefGoogle Scholar
6.Hertel, G., McWhan, D.B., and Rowell, J.M., in “Proceedings of IV Conference on Superconductivity in d- and f-Band Metals,” edited by Weber, W. and Buckel, W., (Kernsforschungsanlage, Karlsruhe, W. Germany, 1982).Google Scholar
7.Lepetre, Y., Schuller, I.K., Rasigni, G., Rivoira, R., Philip, R., and Dhez, P., SPIE Proc. 563 (1985) p. 258.CrossRefGoogle Scholar
8.McWhan, D.B., in Ref. 1., p. 43.Google Scholar
9.Barbee, T.W. Jr., in Ref. 1., p. 313.Google Scholar
10.Schuller, I.K., Phys. Rev. Lett. 44 (1980) p. 1597.CrossRefGoogle Scholar
11.Ruggiero, S.T., Barbee, T.W. Jr., and Beasley, M.R., Phys. Rev. Lett. 45 (1980) p. 1299.CrossRefGoogle Scholar
12.Khan, M.R., Chun, C.S.L., Felcher, G.P., Grimsditch, M., Kueny, A., Falco, C.M., and Schuller, I.K., Phys. Rev. B 27 (1983) p. 7186.CrossRefGoogle Scholar
13.Camley, R.E., Rahman, T.S., and Mills, D.L., Phys. Rev. B 27 (1983) p. 261; P. Grünberg and K. Mika, Phys. Rev. B 27 (1983) p. 2955.CrossRefGoogle Scholar
14.Hilliard, J.E., in Modulated Structures-1979, edited by Cowley, J.M., Cohen, J.B., Salamon, M.B., and Wuensch, B.J., AIP Conf. Proc. 53 (1979) p. 407.Google Scholar
15.Salamon, M.B., Sinha, S., Rhyne, J.J., Cunningham, J.E., Erwin, R.W., Borchers, J., and Flynn, C.P., Phys. Rev. Lett. 56 (1986) p. 259.CrossRefGoogle Scholar
16.Thaler, B.J., Ketterson, J.B., and Hilliard, J.E., Phys. Rev. Lett. 41 (1978) p. 336.CrossRefGoogle Scholar
17.Werner, T.R., Banerjee, I., Yang, Q.S., CFalco, M., and Schuller, I.K., Phys. Rev. B 26 (1982) p. 2224.CrossRefGoogle Scholar
18.Brodsky, M.B., Phys. Rev. B 25 (1982) p. 6060.CrossRefGoogle Scholar
19.Moog, E.R. and Bader, S.D., Superlattices and Microstructures, 1 (1985) p. 543.CrossRefGoogle Scholar
20.Schwarz, R.B. and Jóhnson, W.L., Phys. Rev. Lett. 51 (1983) p. 415.CrossRefGoogle Scholar
21.Kueny, A., Grimsditch, M., Miyano, K., Banerjee, I., CFalco, M., and Schuller, I.K., Phys. Rev. Lett. 48 (1982) p. 166.CrossRefGoogle Scholar
22.Zhou, W-S., Wong, H.K., Owers-Bradley, J.R., and Halperin, W.P., Physica 108B (1981) p. 953.Google Scholar
23.Majkrzak, C.F., Cable, J.W., Kwo, J., Hong, M., McWhan, D.B., Yafet, Y., Waszczak, J.V., and Vettier, C., Phys. Rev. Lett. 56 (1986) p. 2700.CrossRefGoogle Scholar
24. See for instance, Fu, C.L., Freeman, A.J., and Oguchi, T., Phys. Rev. Lett. 54 (1985) p. 2700.CrossRefGoogle Scholar
25.Homma, H., Yang, K-Y., and Schuller, I.K., in Ref. 3 (and to be published).Google Scholar
26.Saxena, A.M. and Majkrzak, C.F., in Thin Film Multilayer Neutron Monochromators, edited by Faber, J. Jr., AIP Conf. Proc. 89 (1982) p. 193.Google Scholar
27.Haelbich, R-P., Segmüller, A., and Spiller, E., Appl. Phys. Lett. 34 (1979) p. 184.CrossRefGoogle Scholar