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High-resolution silicon Kβ X-ray spectra and crystal structure

Published online by Cambridge University Press:  05 July 2018

J. Purton  and
D. S. Urch
J. Purton
Affiliation:
Department of Chemistry, Queen Mary College, Mile End Road, London E1 4NS
D. S. Urch
Affiliation:
Department of Chemistry, Queen Mary College, Mile End Road, London E1 4NS
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Abstract

High-resolution X-ray emission spectra (XES) are presented for minerals with a variety of structures. The participation of the Si 3p orbitals in bonding is influenced by the local structure around the silicon atom. In orthosilicates the distortion of the SiO4 4--tetrahedron influences both peak-width and the intensity of the high-energy shoulder of the Si-Kβ spectrum. In minerals containing Si-O-Si bonds there is mixing of the Si 3s and 3p orbitals giving rise to a peak on the low-energy side of the main Si-Kβ peak. When combined with X-ray photoelectron spectra (XPS), a complete molecular orbital picture of bonding can be established.

Keywords

X-ray emission spectroscopysilicon Kβ X-raysilicateselectronic structurechemical bond

Information

Type
Research Article
Information
Mineralogical Magazine , Volume 53 , Issue 370 , April 1989 , pp. 239 - 244
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1989

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References

Brytov, I. A., Dikov, Y. P., Romashchenko, Y. N., Dolin, S. P. and Deol'skii, E. I. (1976) X-ray spectral study of silicate and aluminosilicate minerals. Izvestiya Akademii Nauk SSSR, Seriya Fizicheskaya 40, 164-9 (Eng. trans.).Google Scholar
Dodd, C. G. and Glenn, G. L. (1969) A survey of chemical bonding in silicate minerals by X-ray spectroscopy. Am. Mineral. 54, 1299-311.Google Scholar
Haycock, D. E. and Urch, D. S. (1982) Resolution enhancement for a commercial X-ray fluorescence spectrometer. J. Phys. E: Sci. Instrum. 15, 40-3.CrossRefGoogle Scholar
Myers, K. and Andermann, G. (1972) High resolution X-ray emission study of central atom-ligand bonding in phosphorus oxy anions. J. Phys. Chem. 76, 3975-82.CrossRefGoogle Scholar
Nefedov, V. I. and Fomichev, V. A. (1968) Electronic structure of tetrahedral oxyanions of elements of the third period. J. Struct. Chem. 9, 107-12.CrossRefGoogle Scholar
Robinson, K., Gibbs, G. V. and Ribbe, P. H. (1971) The structure of zircon: a comparison with garnet. Am. Mineral. 56, 782-90.Google Scholar
Taniguchi, K. (1984) Chemical-state analysis by means of soft X-ray spectroscopy II. Kβ spectra for phosphorus, sulfur and chlorine in various compounds. Bull. Chem. Soc. Japan 57, 915-20.CrossRefGoogle Scholar
Tossell, J. A. (1975) The electronic structures of silicon, aluminium and magnesium in tetrahedral coordination with oxygen from SCF-Xα MO calculations. J. Am, Chem. Soc. 97, 4840-4.CrossRefGoogle Scholar
Tossell, J. A. and Gibbs, G. V. (1976) A molecular orbital study of shared-edge distortions in linked polyhedra. Am. Mineral. 61, 287-94.Google Scholar
Tossell, J. A. and Gibbs, G. V. (1977) Molecular orbital studies of geometries and spectra of minerals and inorganic compounds. Phys. Chem. Minerals 2, 21-57.CrossRefGoogle Scholar
Tossell, J. A. and Gibbs, G. V., Vaughan, D. J. and Johnson, K. H. (1973) X-ray photoelectron, X-ray emission and UV spectra of SiO 2 calculated by the SCF Xa scattered wave method. Chem. Phys. Lett. 20, 32-34.CrossRefGoogle Scholar
Urch, D. S. (1970) The origin and intensities of low energy satellite lines in X-ray emission spectra: a molecular orbital interpretation. J. Phys. C: Solid State Phys. 3, 1275-91.CrossRefGoogle Scholar