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The effects of surface damage and oxide films on the optical properties of cuprite

Published online by Cambridge University Press:  05 July 2018

P. Rastall ,
K. Mc. Clarke  and
E. F. I. Roberts
P. Rastall
Affiliation:
Department of Metallurgy and Materials, City of London Polytechnic, Whitechapel High Street, London E1 7PF
K. Mc. Clarke
Affiliation:
Department of Metallurgy and Materials, City of London Polytechnic, Whitechapel High Street, London E1 7PF
E. F. I. Roberts
Affiliation:
Department of Metallurgy and Materials, City of London Polytechnic, Whitechapel High Street, London E1 7PF
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Summary

Spectral ellipsometry in the range 240 nm to 540 nm has been used to investigate the influence of surface damage induced by mechanical polishing and surface films of CuO on the optical properties of pure synthetic cuprite. Comparison is made between bulk CuO and thin film CuO produced by low-temperature oxidation of cuprite. The effects of strain and disorder are discussed in relation to the suppression of excitonic transitions. Recently developed techniques have been used to simplify the analysis and take full advantage of the spectral data.

Information

Type
Research Article
Information
Mineralogical Magazine , Volume 43 , Issue 329 , March 1980 , pp. 633 - 637
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1980

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References

Agekyan, (V. T.), Kuz'mina, (I. P.), Lobachev, (A. N.), Predtchenski, (B. S.), Starostina, (L. S.) and Kaidukov, (N. M.), 1975. J. Appl. Spectrosc. 22, 582. (trans. of Zh. PriM. Spektr.) CrossRefGoogle Scholar
Clarke, (K. Mc.), 1979. C.N.A.A. Ph.D. Thesis. City of London Polytechnic.Google Scholar
Donovan, (T. M.), Ashley, (E. J.), and Bennet, (H. E.), 1963. J. Opt. Soc. Am. 53, 1403.CrossRefGoogle Scholar
Gross, (E. F.), 1962. Soy. Phys. Uspekhi, 5, 195. (trans, of Uspekhi fiz. Nauk.) CrossRefGoogle Scholar
Hayfield, (P. C. S.), 1961. Ist Int. Cong. Metallic Corrosion, April, p. 670.Google Scholar
Hunt, (R.). Private communication, to be published in C.N.A.A. Ph.D. Thesis. City of London Polytechnic.Google Scholar
Ladelfe, (P. C.), Czanderna, (A. W.), and Biegen, (J. R.), 1972. Thin Solid Film, 10, 403.CrossRefGoogle Scholar
Roberts, (E. F. I.) and Meadows, (A.), 1964. J. phys. E. 7, 379.CrossRefGoogle Scholar
Roberts, (E. F. I.) and Rastall, (P.), 1978. Mineral. Mag. 42, 505.CrossRefGoogle Scholar
Spyrideles, (J.), Stoimenos, (J.), and Economov, (N.), 1977. Phys. Stat. Solidi, 20, 623.CrossRefGoogle Scholar
Vedam, (K.) and Malin, (M.), 1974. Mat. Res. Bull. 9, 1503.CrossRefGoogle Scholar