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Simulation of the effect of random noise on Gaussian and Lorentzian widths in a Voigt profile

Published online by Cambridge University Press:  10 March 2003

J. M. LUQUE ,
M. D. CALZADA  and
M. SÁEZ
J. M. LUQUE
Affiliation:
Grupo de Espectroscopía de Plasmas, Departamento de Física, Campus de Rabanales, Universidad de Córdoba, 14071 Córdoba, Spain (fa1cazal@uco.es)
M. D. CALZADA
Affiliation:
Grupo de Espectroscopía de Plasmas, Departamento de Física, Campus de Rabanales, Universidad de Córdoba, 14071 Córdoba, Spain (fa1cazal@uco.es)
M. SÁEZ
Affiliation:
Grupo de Espectroscopía de Plasmas, Departamento de Física, Campus de Rabanales, Universidad de Córdoba, 14071 Córdoba, Spain (fa1cazal@uco.es)
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Abstract

Experimental line profiles can be altered by so-called spectral interference that appears due to different causes. One of the most commonly appearing sources of interference is random noise due to the detector used for measuring the spectra in the laboratory. In this work, the noise is studied using a simulation procedure. This study helps to pinpoint the changes that the noise produces in the parameters of the experimental profiles and, consequently, in the information provided by them.

Information

Type
Research Article
Information
Journal of Plasma Physics , Volume 68 , Issue 3 , April 2002 , pp. 203 - 209
Copyright
© 2002 Cambridge University Press

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