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Transmission electron microscopy observation in a liquid-phase-sintered SiC with oxynitride glass

Published online by Cambridge University Press:  31 January 2011

Guo-Dong Zhan ,
Mamoru Mitomo ,
Young-Wook Kim ,
Rong-Jun Xie  and
Amiya K Mukherjee
Guo-Dong Zhan*
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, California 95616
Mamoru Mitomo
Affiliation:
National Institute for Research in Inorganic Materials, Namiki 1–1, Tsukuba-shi, Ibaraki 305, Japan
Young-Wook Kim
Affiliation:
Department of Materials Science and Engineering, University of Seoul, Seoul 130–743, Korea
Rong-Jun Xie
Affiliation:
National Institute for Research in Inorganic Materials, Namiki 1–1, Tsukuba-shi, Ibaraki 305, Japan
Amiya K Mukherjee
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, California 95616
*
a)Address all correspondence to this author.
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Abstract

Using a pure α–SiC starting powder and an oxynitride glass composition from the Y–Mg–Si–Al–O–N system as a sintering additive, a powder mixture was hot-pressed at 1850 °C for 1 h under a pressure of 20 MPa and further annealed at 2000 °C for 4 h in a nitrogen atmosphere of 0.1 MPa. High-resolution electron microscopy and x-ray diffraction studies confirmed that a small amount of β–SiC was observed in the liquid-phase-sintered α–SiC with this oxynitride glass, indicating stability of β–SiC even at high annealing temperature, due to the nitrogen-containing liquid phase.

Information

Type
Rapid Communications
Information
Journal of Materials Research , Volume 16 , Issue 8 , August 2001 , pp. 2189 - 2191
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1Heuer, A.H., Fryburg, G.A., Ogbuji, L.U., Mitchell, T.E., and Shinozaki, S., J. Am. Ceram. Soc. 61, 406 (1978).CrossRefGoogle Scholar
2Mitchell, T.E., Ogbuji, L.U., and Heuer, A.H., J. Am. Ceram. Soc. 61, 412 (1978).CrossRefGoogle Scholar
3Ogbuji, L.U., Mitchell, T.E., and Heuer, A.H., J. Am. Ceram. Soc. 64, 91 (1981).CrossRefGoogle Scholar
4Ogbuji, L.U., Mitchell, T.E., Heuer, A.H., and Shinozaki, S., J. Am. Ceram. Soc. 64, 100 (1981).CrossRefGoogle Scholar
5Padture, N.P. and Lawn, B.R., J. Am. Ceram. Soc. 77, 2518 (1994).CrossRefGoogle Scholar
6Zhan, G-D., Mitomo, M., Tanaka, H., and Kim, Y-W., J. Am. Ceram. Soc. 83, 1369 (2000).CrossRefGoogle Scholar
7Sokhor, M.I., Kondakov, V.G., and Fel’dgun, L.I., Sov. Phys. Dokl. 12, 749 (1968).Google Scholar
8Whitney, E.D. and Shaffer, P.T.B., High Temp.—High Pres. 1, 107 (1969).Google Scholar
9Jepps, N.W. and Page, T.F., J. Am. Ceram. Soc. 64, c–177 (1981).CrossRefGoogle Scholar
10Yang, J.W. and Pirouz, P., J. Mater. Res. 8, 2902 (1993).CrossRefGoogle Scholar
11Turan, S. and Knowles, K.M., J. Am. Ceram. Soc. 79, 2892 (1996).CrossRefGoogle Scholar
12Loehman, R.E., J. Am. Ceram. Soc. 62, 491 (1979).CrossRefGoogle Scholar
13Tanaka, H. and Iyi, N., J. Ceram. Soc. Jpn. 101, 1313 (1993).CrossRefGoogle Scholar
14Allard, L.F., Nolan, T.A., and Rawlins, M.H., Am. Ceram. Soc. Bull. 68, 1450 (1989).Google Scholar
15Duval-Riviere, M.L. and Vicens, J., Philos. Mag. A,69, 451 (1994).CrossRefGoogle Scholar