Hostname: page-component-cb9f654ff-k7rjm Total loading time: 0 Render date: 2025-08-30T14:01:22.733Z Has data issue: false hasContentIssue false
  • English
  • Français

Smooth surface of Bi-Sr-Ca-Cu-O thin films on the Y3Al5O12 (YAG) substrate

Published online by Cambridge University Press:  03 March 2011

Nobuhiko Kubota ,
Yuh Shiohara  and
Shoji Tanaka
Nobuhiko Kubota
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10-13 Shinonome 1-Chome, Koto-ku, Tokyo 135, Japan
Yuh Shiohara
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10-13 Shinonome 1-Chome, Koto-ku, Tokyo 135, Japan
Shoji Tanaka
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10-13 Shinonome 1-Chome, Koto-ku, Tokyo 135, Japan
Get access

Abstract

We prepared the superconducting Bi-Sr-Ca-Cu-O thin films on Y3Al5O12 (YAG) single crystal substrates by metal-organic chemical vapor deposition (MOCVD). This film of 50 nm thickness on a YAG substrate showed c-axis orientation clearly, and the zero-resistivity (Tc-zero) was achieved at 66 K. The film has the advantageous property of surface smoothness compared with the film fabricated on MgO and SrTiO3 single-crystal substrates. The surface property of the YAG substrate seems to influence the film quality.

Information

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 5 , May 1994 , pp. 1104 - 1111
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1Hawley, M., Raistick, I. D., Beery, J. G., and Houlton, R. J., Science 251, 1587 (1991).CrossRefGoogle Scholar
2Gerber, C., Anderson, D., Bednorz, J. G., Mannhart, J., and Schlom, D. G., Nature 350, 279 (1991).CrossRefGoogle Scholar
3Terashima, T., Bando, Y., Iijima, K., Yamamoto, K., Hirata, K., Hayashi, K., Kamigaki, K., and Terauchi, H., Phys. Rev. Lett. 65, 2684 (1990).CrossRefGoogle Scholar
4Zheng, X. Y., Lowndes, D. H., Zhu, S., Budai, J. D., and Warmack, R. J., Phys. Rev. B 45, 7584 (1992).CrossRefGoogle Scholar
5Kanai, M., Kawai, T., and Kawai, S., Jpn. J. Appl. Phys. 31, L331 (1992).CrossRefGoogle Scholar
6Golden, S. J., Lange, F. F., Clarke, D. R., Chang, L. D., and Necker, C. T., Appl. Phys. Lett. 61, 351 (1992).CrossRefGoogle Scholar
7Raina, K. K., Narayanan, S., and Pandey, R. K., J. Mater. Res. 7, 2303 (1992).CrossRefGoogle Scholar
8Kubota, N., Sugimoto, T., Shiohara, Y., and Tanaka, S., J. Mater.Res. 8, 978 (1993).CrossRefGoogle Scholar
9Sugimoto, T., Kubota, N., Shiohara, Y., and Tanaka, S., Appl. Phys. Lett. 60, 1387 (1992).CrossRefGoogle Scholar
10Sugimoto, T., Nakagawa, M., Shiohara, Y., and Tanaka, S., Physica C 192, 108 (1992).CrossRefGoogle Scholar