Hostname: page-component-54dcc4c588-nx7b4 Total loading time: 0 Render date: 2025-09-22T11:37:56.078Z Has data issue: false hasContentIssue false
  • English
  • Français

Preparation and characterization of the superconducting system Bi1−xPbxSrCaCu2Oy

Published online by Cambridge University Press:  31 January 2011

E. Agostinelli ,
J. Bohandy ,
W. J. Green ,
T. E. Phillips ,
B. F. Kim ,
F. J. Adrian  and
K. Moorjani
E. Agostinelli
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20707
J. Bohandy
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20707
W. J. Green
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20707
T. E. Phillips
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20707
B. F. Kim
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20707
F. J. Adrian
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20707
K. Moorjani
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20707
Get access

Abstract

The superconducting properties of the system Bi1−xPbxSrCaCu2Oy have been studied as a function of lead concentration and preparation conditions. Energy dispersive x-ray analysis indicates the nominal stoichiometry is preserved up to x = 0.2 and for this concentration, zero resistance occurs at 97 K. Magnetically modulated microwave absorption measurements provide a global probe of the samples and show that resistance measurements alone can give a false impression of the quality of the materials.

Information

Type
Articles
Information
Journal of Materials Research , Volume 4 , Issue 5 , October 1989 , pp. 1103 - 1110
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1Maeda, H.Tanaka, Y.Fukutomi, M. and Asano, T.Jpn. J. Appl. Phys. 27, L209 (1988).CrossRefGoogle Scholar
2Togano, K.Kumakura, H.Maeda, H.Takahashi, K. and Nakao, M.Jpn. J. Appl. Phys. 27, L323 (1988).CrossRefGoogle Scholar
3Sumiyama, A.Yoshitomi, T.Endo, H.Tsuchiya, J.Kijima, N.Mizuno, M. and Oguri, Y.Jpn. J. Appl. Phys. 27, L542 (1988).CrossRefGoogle Scholar
4Kumakura, H.Takahashi, K.Dietderich, D.R.Togano, K. and Maeda, H.Appl. Phys. Lett. 52, 2064 (1988).CrossRefGoogle Scholar
5Kitazawa, K.Yaegashi, S.Kishio, K.Hasegawa, T.Kanazawa, N.Park, K. and Fueki, K. Adv. Ceram. Mater (to be published).Google Scholar
6Hetherington, C. J. D.Ramesh, R.O'Keefe, M. A., Kilaas, R.Thomas, G.Green, S.M. and Luo, H. L.Appl. Phys. Lett. 53 (11), 1016 (1988).CrossRefGoogle Scholar
7Nature 333, 200 (19 May 1988).CrossRefGoogle Scholar
8Takano, M.Takada, J.Oda, K.Hitaguchi, H.Miura, Y.Ikeda, Y.Tomii, Y. and Mazaki, H. H.Jpn. J. Appl. Phys. 27, L1041 (1988).CrossRefGoogle Scholar
9Balachandran, U.Shi, D.Santos, D. I. Dos, Graham, S. W.Patel, M. A.Tani, B.Vandervoort, K.Claus, H. and Poeppel, R. B. (to be published).Google Scholar
10Togano, K.Kumakura, H.Maeda, H.Yanigisawa, E. and Takahashi, K.Appl. Phys. Lett. 53, 1329 (1988).CrossRefGoogle Scholar
11Tallon, J.L.Buckley, R.G.Gilberd, P. W.Presland, M. R.Brown, I.W.M., Bowden, M. E.Christian, L. A. and Goguel, R.Nature 333, 153 (12 May 1988).CrossRefGoogle Scholar
12Zandbergen, H.W.Huang, Y. K. M.Menken, J.V.Li, J.N. K. Kad-owaki, Menovsky, A. A.Tendeloo, A. van, and Amelinckx, S.Nature 332, 620 (14 April 1988).CrossRefGoogle Scholar
13Kim, B.F.Bohandy, J.Moorjani, K. and Adrian, F. J.J. Appl. Phys. 63, 2029 (1988); K. Moorjani J., Bohandy, F.J., Adrian, B.F., Kim, R. D., Shull, C.K., Chiang, L.J., Swartzendruber and L. H., Bennett Phys. Rev. B 36, 4036 (1987); K., Moorjani, B.F., Kim, J., Bohandy and F. J., Adrian Rev. of Solid State Sci. 2, 263 (1988).CrossRefGoogle Scholar
14Mikalsen, D.J.Roy, R. A.Yee, D.S., Shivashankar, S.A. and Cuomo, J.J.J. Mater. Res. 3, 613 (1988).CrossRefGoogle Scholar
15Hazen, R. M.Prewitt, C. T.Angel, R. J.Ross, N. L.Finger, L. W.Hadidiacos, C.A.Veblen, D.R.Heaney, P.J.Hor, P.H.Meng, R.L.Sun, Y.Y.Wang, Y.Q.Xue, Y.Y.Huang, Z.J.Gao, L.Bechtold, J. and Chu, C.W.Phys. Rev. Lett. 60, 1174 (1988).CrossRefGoogle Scholar
16Bohandy, J.Kim, B.F.Adrian, F.J. and Moorjani, K. Phys. Rev. B (in press).Google Scholar
17Takayama-Muromachi, E., Uchida, Y.Matsui, Y.Onoda, M. and Kato, K.Jpn. J. Appl. Phys. 27, L556 (1988).CrossRefGoogle Scholar
18Green, S.M.Jiang, C.Mei, Y.Luo, H.L. and Politis, C.Phys. Rev. B 38, 5016 (1988).CrossRefGoogle Scholar
19Ramesh, R.Thomas, G.Green, S.Jiang, C.Mei, Y.Rudee, M.L. and Luo, H.L.Phys. Rev. B 38, 7070 (1988).CrossRefGoogle Scholar