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Post-annealing induced defects and their influences on Bi2Sr2CaCu2Oy superconducting thin films

Published online by Cambridge University Press:  03 March 2011

Xiao Feng Zhang
Xiao Feng Zhang
Affiliation:
Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, P.O. Box 2724, Beijing 100080, People's Republic of China
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Abstract

Defects in Bi2Sr2Can-1CunOy superconducting thin films annealed in an oxygen atmosphere are examined by high-resolution electron microscopy (HREM). In addition to the majority 2212 (n = 2) phase, subsequent slabs of other homologous phases with n values up to n = 10 are found intergrown in the films. Large-angle tilt grain boundaries and various secondary phases such as CuO, Sr-Cu-O oxides are formed in the films. The occurrence of these defects is attributed to an inhomogeneous Sr, Ca, and Cu distribution induced by the post-annealing. Superconducting transition temperature (Tc) is increased by the annealing under suitable conditions.

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Articles
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Journal of Materials Research , Volume 10 , Issue 8 , August 1995 , pp. 1872 - 1877
Copyright
Copyright © Materials Research Society 1995

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