Hostname: page-component-7dd5485656-bvgqh Total loading time: 0 Render date: 2025-10-31T08:56:29.727Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure and conversion electron Mössbauer studies of M decrease in Fe3O4 films

Published online by Cambridge University Press:  31 January 2011

C. Ortiz ,
C. Hwang ,
A. H. Morrish  and
X. Z. Zhou
C. Ortiz
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099
C. Hwang
Affiliation:
IBM General Products Division, 5600 Cottle Road, San Jose, California 95193
A. H. Morrish
Affiliation:
Department of Physics, University of Manitoba, Winnipeg, Manitoba, Canada R3T 2N2
X. Z. Zhou
Affiliation:
Department of Physics, University of Manitoba, Winnipeg, Manitoba, Canada R3T 2N2
Get access

Abstract

This paper analyzes the influence of the deposition conditions (substrate temperature and oxygen flow) on the magnetic moment of Fe3O4 films grown by reactive RF sputtering. With conversion electron Mössbauer spectroscopy and transmission electron microscopy of specific microstructures we have identified different mechanisms which can contribute to the decrease of M in our samples: decrease of average grain size (superparamagnetism) and distortion of the lattice which may induce mispopulation of tetrahedral and octahedral sites and decrease of crystalline quality.

Information

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 4 , April 1990 , pp. 824 - 828
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1Ortiz, C., Lim, G., Chen, M. M., and Castillo, G., Journal of Materials Research 3, 344 (1988).CrossRefGoogle Scholar
2 For instance, Feng, J.Y., Bajorek, C. H., and Nicolet, M. A., IEEE Trans. Mag. 9, 344 (1988).Google Scholar
3Picone, P. J. and Morrish, A. H., J. Appl. Phys. 53, 2471 (1982).CrossRefGoogle Scholar
4Kuendig, W. and Hargrove, R.S., Solid State Commun. 7, 223 (1969).CrossRefGoogle Scholar
5Sawatzky, G.A., Van der Wonde, F., and Morrish, A. H., Phys. Rev. 183, 383 (1969).CrossRefGoogle Scholar
6 This overlap can often be reduced by applying an external magnetic d. In our case, we could not do so because we used a gas detector.Google Scholar
7Hwang, C. and Chen, M. M., J. Appl. Phys. 63, 3275 (1988).Google Scholar
8Haneda, K. and Morrish, A. H., Solid State Commun. 22, 779 (1977).CrossRefGoogle Scholar
9Haneda, K. and Morrish, A. H., Proc. Int. Symp. Physics Mag. Materials, Sendai, Japan, 214 (1987).Google Scholar
10Roggwiller, P. and Kundig, W., Solid State Commun. 12, 901 (1973).CrossRefGoogle Scholar
11Fujinani, M. and Ujikira, Y., Hyperfine Interactions 29, 1475 (1986).CrossRefGoogle Scholar
12Parkin, S. (private communication).Google Scholar
13Terashim, T. and Bando, Y., J Phys. Soc. Japan 54, 3920 (1985).CrossRefGoogle Scholar