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Latest developments for microstructural and chemical characterization of diffusion bonding in superplastic 8090 Al–Li alloys

Published online by Cambridge University Press:  31 January 2011

A. Ureña ,
J. M. Gómez de Salazar ,
J. J. Martín  and
J. Quiñones
A. Ureña
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
J. M. Gómez de Salazar
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
J. J. Martín
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
J. Quiñones
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
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Abstract

This paper describes a new application of two complementary surface characterization techniques to study solid-state bonding in an Al–Li alloy. Through the two mentioned techniques, Atomic Force Microscopy (AFM) and Secondary Ion Mass Spectrometry (SIMS), important findings about what takes place in the bond interface have been determined. These findings enclose both the formation of discontinuous mixed oxides and the evolution of Li through the bond line and into theadjacent diffusion affected zones. Homogenization of Li and Cu alloyelements has been detected even in those cases where a metallic interlayer was used to favor the union.

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Articles
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Journal of Materials Research , Volume 11 , Issue 1 , January 1996 , pp. 63 - 71
Copyright
Copyright © Materials Research Society 1996

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