Hostname: page-component-745bb68f8f-lrblm Total loading time: 0 Render date: 2025-01-25T21:57:21.170Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron microscopy of a Gd–Ba–Cu–O superconductor

Published online by Cambridge University Press:  31 January 2011

R. Ramesh ,
G. Thomas ,
R. L. Meng ,
P. H. Hor  and
C. W. Chu
R. Ramesh
Affiliation:
Department of Materials Science and Mineral Engineering and National Center for Electron Microscopy, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
G. Thomas
Affiliation:
Department of Materials Science and Mineral Engineering and National Center for Electron Microscopy, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
R. L. Meng
Affiliation:
Department of Physics and Space Vacuum Epitaxy Center, University of Houston, Houston, Texas 77004
P. H. Hor
Affiliation:
Department of Physics and Space Vacuum Epitaxy Center, University of Houston, Houston, Texas 77004
C. W. Chu
Affiliation:
Department of Physics and Space Vacuum Epitaxy Center, University of Houston, Houston, Texas 77004
Get access

Abstract

An electron microscopy study has been carried out to characterize the microstructure of a sintered Gd–Ba–Cu–O superconductor alloy. The GdBa2Cu3O7−x phase in the oxygen annealed sample is orthorhombic while in the vacuum annealed sample it is tetragonal. It is shown that the details of the fine structure in the [001] zone axis convergent beam patterns can be used to distinguish between the orthorhombic form and the tetragonal form. In addition to this matrix phase, an amorphous phase is frequently observed at the triple grain junctions. Gd-rich inclusions have been observed inside the matrix phase.

Type
Articles
Information
Journal of Materials Research , Volume 4 , Issue 3 , June 1989 , pp. 515 - 520
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Bednorz, G. and Muller, K. A.Z. Phys. 64 189 (1986).CrossRefGoogle Scholar
2Chu, C.W.Hor, P.H.Meng, R.L.Gao, L.Huang, Z. G. and Wang, Y. Q.Phys. Rev. Lett. 58 405 (1987).CrossRefGoogle Scholar
3Wu, M. K.Ashburn, J. R.Torng, C. J.Hor, P. H.Meng, R. L.Gao, L.Huang, Z.J.Wang, Y.Q. and Chu, C.W.Phys. Rev. Lett. 58 908 (1987).CrossRefGoogle Scholar
4Hor, P. H.Meng, R. L.Wang, Y. Q.Gao, L.Huang, Z. J.Bechtold, J.Forster, K. and Chu, C. W.Phys. Rev. Lett. 58 1891 (1987).CrossRefGoogle Scholar
5Grant, P. M.Beyers, R. B.Engler, E. M.Lim, G.Parkin, S. S. P.Ramirez, M. L.Lee, V. Y.Nazzal, A.Vasquez, J. E. and Savoy, R. J.Phys. Rev. B35 7242 (1987).CrossRefGoogle Scholar
6Siegrist, T.Sunshine, S.Murphy, D.W.Cava, R.J. and Zahurak, S.M.Phys. Rev. B35 7137 (1987).CrossRefGoogle Scholar
7Hazen, R. M.Finger, L. W.Angel, R.J.Prewitt, C.T.Ross, N.L.Mao, H.K.Hadidiacos, C.G.Hor, P.H.Meng, R.L. and Chu, C.W.Phys. Rev. B35 7238 (1987).CrossRefGoogle Scholar
8Cava, S.R.J.Batlogg, B.Dover, R.B. van, Murphy, D.W.Sunshine, S.Siegrist, T.Remeika, J.P.Reitman, E. A.Zahurak, S. and Espinosa, , Phys. Rev. Lett. 58 1676 (1987).CrossRefGoogle Scholar
9Beyers, R.Lim, G.Engler, E. M.Savory, R.J.Shaw, T. M.Dinger, T.R.Gallagher, W.J. and Sandstrom, R.L.Appl. Phys. Lett. 50 1918 (1987).CrossRefGoogle Scholar
10Hinks, D.G.Soderholm, L.Capone, D.W. II , Jorgensen, J.D.Schuller, I. K.Serge, C.U.Zhang, K. and Grace, J.D.Phys. Rev. Lett, (in press).Google Scholar
11Tendeloo, G. van, Zandbergen, H. and Amelinckx, S.Solid State Com-mum. (in press).Google Scholar
12Zanbergen, H.W.Tendeloo, G. van, Okabe, T. and Amelinckx, S.Phys. Status Solidi (in press).Google Scholar
13Eaglesham, D.J.Humphreys, C.J.Clegg, W. J.Harmer, M.A.Alford, N. McN, and Birchall, J.D.Adv. Cer. Matls. 2 662 (1987).Google Scholar
14Sung, C.M.Peng, P.Gorton, A.Chou, Y. T.Jain, H.Smyth, D.M. and Harmer, M.P.Adv. Ceram. Matls. 2 668 (1987).Google Scholar
15Beyers, R.Lim, G.Engler, E. M.Lee, V. Y.Ramirez, M. L.Savoy, R. J.Jacowitz, R.D.Shaw, T. M.LaPlaca, S.Boehme, R.Tsuei, C. C.Park, S.I.Shafer, M.J. and Gallagher, W.J.Appl. Phys. Lett. (in press).Google Scholar
16Buxton, B.F.Eades, J.A.Steeds, J.W. and Rackham, G. M.Philos. Trans. R. Soc. of London 281A, 171 (1976).Google Scholar
17Eades, J.A.Appl. Surface Science 26 280 (1986).CrossRefGoogle Scholar
18Steeds, J. W. “Convergent Beam Electron Diffraction,” in Introduction to Analytical Electron Microscopy, edited by Hren, J. J.Goldstein, J.I. and Joy, D. C. (Plenum Press, New York, 1979).Google Scholar