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Defect/surface interactions in heat-treated ceramic thin films

Published online by Cambridge University Press:  31 January 2011

David W. Susnitzky  and
C. Barry Carter
David W. Susnitzky
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
C. Barry Carter*
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
*
b)Address correspondence to this author, Dept. Chem. E. & Mat. S., University of Minnesota, Minneapolis, Minnesota 55455–0132.
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Abstract

The use of transmission electron microscopy to study the interaction of lattice defects with surfaces of heat-treated ceramic materials is discussed. The approach used throughout the work described has been to prepare a thinned sample in a form suitable for imaging in the electron microscope and then to remove all preparation-induced damage by heat-treating the thinned sample. Applications of the technique to the movement and pinning of individual surface steps in alumina and the grooving of antiphase boundaries in silicon carbide are illustrated.

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Type
Articles
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Journal of Materials Research , Volume 6 , Issue 11 , November 1991 , pp. 2403 - 2411
Copyright
Copyright © Materials Research Society 1991

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